Nuvoton Technology Corporation

Te-Ming Tseng

Yeh-Tai Hung

Wen-Yi Li

Wei-Chan Hsu

Po-Sheng Chen

Yeh-tai Hung

Provided is a system for testing a reference voltage circuit applicable to a reference voltage circuit. The reference voltage circuit includes a bandgap reference voltage circuit, switching elements, a first capacitor, a second capacitor and a comparator. The testing system includes a control logic unit. In a test mode, the control logic unit adjusts an allowable value of the comparator to speed up the suitability test of the switching elements.

System and method for testing reference voltage circuit

The present disclosure illustrates a low-power voltage detection circuit, including a threshold voltage detection circuit, a leakage detection circuit and a low-voltage detection circuit. By utilizing the above-mentioned threshold voltage detection circuit and leakage detection circuit, the voltage variations caused by leakage, temperature or process can be detected in the more efficient and power saving way.

Low-power voltage detection circuit

A reference voltage circuit is provided, which includes bandgap reference circuit, bias current generator, first capacitor, second capacitor, comparator and control logic circuit. In the active mode of the control logic circuit, the control logic circuit controls the bandgap reference circuit to deliver bandgap reference voltage. The comparator transmits first comparison signal to control logic circuit when the first and second capacitors are charged to the bandgap reference voltage. The control logic circuit enters low power mode and controls the bandgap reference circuit to stop delivering the bandgap reference voltage. If the comparator detects the potential difference between the first capacitor and second capacitor exceeds the threshold value, the control logic circuit returns to active mode according to the second comparison signal transmitted form the comparator.

Growing community of inventors

Hsinchu, Taiwan

Te-Ming Tseng