Hitachi, Ltd.

Hitachi Vlsi Engineering Corp.

Vlsi Engineering Corporation

Tatsuyuki Ohta

Yutaka Kobayashi

Kazumasa Yanagisawa

Goro Kitsukawa

Hitoshi Miwa

Noboru Akiyama

Atsushi Nozoe

Masayuki Nakamura

Tetsurou Matsumoto

Shoji Wada

Tetsu Udagawa

Yoshitaka Kinoshita

Kyoko Ishii

Hiromi Tsukada

Yoshiaki Ouchi

Kazuo Mihashi

Kunihiko Suzuki

Yuji Yokoyama

Koyo Katsura

Takashi Akioka

A pipeline-operating type memory system is arranged to have a first input unit for receiving a selector address signal for selecting data; a second input unit for receiving at least an address strobe signal, an X address signal and a Y address signal for selecting data; a first unit for receiving the X address signal and the Y address signal, latching these signals utilizing a first clock signal, and continuously outputting at least either of the X and the Y address signals until these address signals are unlatched; and a second unit for latching a selector address data signal output from the first input unit utilizing the first clock signal, and continuously and selectively outputting at least either of the address signal until the signal is unlatched. The memory system operates to transfer data in a manner to suit the pipeline operating cycle at a normal operating mode and at a fast page mode.

Pipeline-operating type memory system capable of reading data from a

A pipeline-operating type memory system is arranged to have a first input unit for receiving a selector address signal for selecting data, a second input unit for receiving at least an address strobe signal, an X address signal and a Y address signal for selecting data; a first unit for receiving the X address signal and the Y address signal, latching these signals utilizing a first clock signal, and continuously outputting at least either of the X and the Y address signals until these address signals are unlatched; and a second unit for latching a selector address data signal output from the first input unit utilizing the first clock signal, and continuously and selectively outputting at least either of the address signal until the signal is unlatched. The memory system operates to transfer data in a manner to suit the pipeline operating cycle at a normal operating mode and at a fast page mode.

A Bi.CMOS semiconductor memory device is provided which includes an arrangement to simultaneously select a plurality of memory cells, followed by using a 3 bit Z addressing arrangement to determine a read or write operation for the simultaneously selected memory cells. To speed up the word line selection, a static selection type operation is used with the word line selecting voltage being greater than signal amplitude of the data lines during the write operation. Also, to speed up the read operation, separate common I/O lines are provided for the read and write operations. Read signals are transmitted as current signals, and then converted to voltage signals for improving reading speed. Also, improved arrangements are provided for resistance structure, logic circuitry, input circuitry, fuse cutting circuitry, drive circuitry, power circuitry, electrostatic protection circuitry, layout structure and testing methods for the semiconductor device.

Dynamic Random Access Type Semiconductor Device

A high-speed memory employing the pipeline technique is disclosed, in which the minimum operating cycle time is reduced by use of a latch circuit for a small signal using a bipolar transistor. A small-signal latch circuit operating at a signal smaller than an output signal level is inserted between an amplifier circuit for amplifying the data held in a memory cell circuit and an output buffer circuit. A switch signal is also interposed between the latch circuit and the amplifier circuit, thereby shortening the cycle time.

Differential amplifier with a latching function and a memory apparatus

Testing method for a semiconductor memory device

A Bi.CMOS semiconductor memory device is provided which includes an arrangement to simultaneously select a plurality of memory cells, followed by using a 3 bit Z addressing arrangement to determine a read or write operation for the simultaneously selected memory cells. To speed up the word line selection, a static selection type operation is used with the word line selecting voltage being greater than signal amplitude of the data lines during the write operation. Also, to speed up the read operation, separate common I/O lines are provided for the read and write operations. Read signals are transmitted as curent signals, and then converted to voltage signals for improving reading speed. Also, improved arrangements are provided for resistance structure, logic circuitry, input circuitry, fuse cutting circuitry, drive circuitry, power circuitry, electrostatic protection circuitry, layout structure and testing methods for the semiconductor device.

Bi-CMOS semiconductor memory device, including improved layout structure

Growing community of inventors

Ohme, Japan

Tatsuyuki Ohta