Jeol Ltd.

Sony Group Corporation

National Institute of Advanced Industrial Science and Technology

Tatsuya Uchida

Kenichi Tsutsumi

Akihiro Tanaka

Tomohiro Ito

Shingo Tanaka

Kazushiro Yokouchi

Noboru Taguchi

Daisuke Shimamura

A sound output device includes a device main frame in which at least a speaker is disposed, and an attachment aid member that is joined to the device main frame. In the sound output device, the attachment aid member includes an annular support portion at least a part of which is inserted into a cavum concha, and the annular support portion includes a contact portion that comes into contact with a part of an ear in the cavum concha while being elastically deformed. With this arrangement, the contact portion of the annular support portion inserted into the cavum concha comes into contact with a part of the ear in the cavum concha while being elastically deformed. Accordingly, it is possible to attach the sound output device to the ear, using the attachment aid member, regardless of the size and the shape of the ear.

Sound output device and attachment aid member

A charged particle beam device includes: a charged particle beam source; an analyzer that analyzes and detects particles including secondary electrons and backscattered charged particles that are emitted from a specimen by irradiating the specimen with a primary charged particle beam emitted from the charged particle beam source; a bias voltage applying unit that applies a bias voltage to the specimen; and an analysis unit that extracts a signal component of the secondary electrons based on a first spectrum obtained by detecting the particles with the analyzer in a state where a first bias voltage is applied to the specimen, and a second spectrum obtained by detecting the particles with the analyzer in a state where a second bias voltage different from the first bias voltage is applied to the specimen.

Charged particle beam device and analysis method

An analysis method includes: obtaining n&#xd7;m pieces of map data by repeating, m times, a map measurement in which n pieces of map data are obtained by scanning a specimen with a primary probe to detect electrons emitted from the specimen with an electron spectrometer, while measurement energy ranges of an analyzer are varied; and generating a spectral map in which a position on the specimen is associated with a spectrum based on the n&#xd7;m pieces of map data, the measurement energy ranges of m times of the map measurement not overlapping each other.

Analysis method and analysis apparatus

An input lens is provided which has a large acceptance solid angle for electrons. The input lens is for use in an electron spectrometer and disposed between an electron source producing electrons and an electron analyzer in the electron spectrometer. The input lens has a reference electrode at a reference potential, a slit, first through nth electrodes, where n is an integer equal to or greater than three, arranged between the reference electrode and the slit, and a second mesh attached to the first electrode. The first through nth electrodes are arranged in this order along an optical axis. The second mesh is at a potential higher than the reference potential.

Input lens and electron spectrometer

An Auger electron microscope includes a processing unit, and the processing unit performs processing of: acquiring an actually measured Auger spectrum obtained by measuring a test specimen containing an analysis target element; acquiring a plurality of first standard Auger spectra obtained by measuring a plurality of standard specimens each containing the same analysis target element but in different chemical states; calculating, based on a test specimen measurement condition that is a measurement condition when the test specimen has been measured and a standard specimen measurement condition that is a measurement condition when the standard specimens have been measured, a plurality of second standard Auger spectra under the test specimen measurement condition from the plurality of first standard Auger spectra; and performing curve fitting calculation of the actually measured Auger spectrum by using the plurality of calculated second standard Auger spectra.

Auger electron microscope and analysis method

A method of generating an elemental map includes: acquiring a plurality of correction channel images by scanning a surface of a standard specimen having a uniform elemental concentration with a primary beam and generating a correction channel image for each channel; generating correction information for each pixel of each correction channel image among the plurality of correction channel images based on a brightness value of the pixel; acquiring a plurality of analysis channel images by scanning a surface of a specimen to be analyzed with the primary beam and generating an analysis channel image for each channel; correcting brightness values of pixels constituting an analysis channel image among the plurality of analysis channel images based on the correction information; and generating an elemental map of the specimen to be analyzed based on the plurality of analysis channel images having pixels with corrected brightness values.

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Tokyo, Japan

Tatsuya Uchida