Hitachi High-Tech Corporation

Tatsuya Hirato

Takashi Yamamoto

Ai Masuda

Akira Kojima

Hiroyuki Chiba

Junpei Hokari

Yuki Suda

Takahiro Usui

Noriyasu Chinone

Electron microscope

Provided is a charged particle beam device using a detector that detects electromagnetic waves, in which a circumstance in a sample chamber can be checked, and a sample is observed with the detector at the same time. The charged particle beam device that observes a sample by using a charged particle beam, including: a component used for observing the sample; a detector that detects electromagnetic waves; a chamber scope that photographs a picture while irradiating the sample with the electromagnetic waves; and a control unit that controls the detector, the component, and an operation of the chamber scope, in which the control unit can be selectively operated in any one of a pre-photographing mode and an observation mode, the control unit causes the chamber scope to photograph the picture, in a state in which an operation of observing the sample by the detector is not performed in the pre-photographing mode, and the control unit, in the observation mode, does not cause the chamber scope to apply the electromagnetic waves, generates a guide image showing a positional relationship between the sample and the component based on the picture, and outputs the guide image.

Charged particle beam device

Growing community of inventors

Tokyo, Japan

Tatsuya Hirato