Kioxia Corporation

Toshiba Memory Corporation

Tatsuro Hitomi

Yasuhito Yoshimizu

Tomoya Sanuki

Masanobu Shirakawa

Marie Takada

Hironori Uchikawa

Tsukasa Tokutomi

Masayuki Miura

Naoaki Kokubun

Masamichi Fujiwara

Kazumasa Yamamoto

Shinichi Kanno

Takashi Fukushima

Keisuke Nakatsuka

Toshio Fujisawa

Arata Inoue

Yoshihiro Ohba

Hitomi Tanaka

Hiroyuki Dohmae

According to one embodiment, when a first case-mounted memory device that includes a first memory device is not connected to a slot of a host apparatus and is stored in a second stocker, the host apparatus causes a second transport device to transport the first case-mounted memory device to the slot, and to connect it thereto. When the first case-mounted memory device is not connected to the slot and is not stored in the second stocker, the host apparatus causes a first transport device to transport the first memory device from a first stocker to a mounter, causes the mounter to mount the first memory device in a case, and causes the second transport device to transport the first case-mounted memory device to the slot and to connect it thereto.

Storage system

According to one embodiment, a storage device includes a control apparatus and a stocker. The control apparatus writes data to or reads data from a storage medium that includes a plurality of non-volatile memory chips. The stocker stores a plurality of the storage media that are detached from the control apparatus. The control apparatus includes a first temperature control system. The first temperature control system raises temperature of the storage medium to a first temperature or higher. The stocker includes a second temperature control system. The second temperature control system cools the storage medium to a second temperature or lower. The second temperature is lower than the first temperature.

Storage device and control method

A method of processing a memory system that includes a substrate with a connector and a semiconductor memory chip connected to the connector is provided. The method includes detaching the semiconductor memory chip from the connector, performing an annealing process with respect to the semiconductor memory chip detached from the connector, and after the annealing process, attaching the semiconductor memory chip to the connector on the substrate.

Memory system and processing method of memory system

A memory chip unit includes a pad electrode including first and second portions, and a memory cell array. A prober includes a probe card and a movement mechanism. The probe card includes a probe electrode to be in contact with the pad electrode, and a memory controller electrically coupled to the probe electrode and executes reading and writing on the memory cell array. The movement mechanism executes a first operation that brings the probe electrode into contact with the first portion and does not bring the probe electrode into contact with the second portion, and a second operation that does not bring the probe electrode into contact with the first portion and brings the probe electrode into contact with the second portion.

Storage system, memory chip unit, and wafer

In general, according to an embodiment, a memory system includes a memory device including a memory cell; and a controller. The controller is configured to: receive first data from the memory cell in a first data reading; receive second data from the memory cell in a second data reading that is different from the first data reading; convert a first value that is based on the first data and the second data, to a second value in accordance with a first relationship; and convert the first value to a third value in accordance with a second relationship that is different from the first relationship.

Memory system

According to one embodiment, a storage device includes a stage on which a semiconductor wafer can be mounted, wherein data is capable of being read from the semiconductor wafer or data is capable of being written to the semiconductor wafer. The storage device further includes a plurality of probe pins for reading or writing data, and a controller connected the probe pins. The semiconductor wafer includes electrodes connectable to the probe pins, a first memory area that can store user data, and a second memory area that can store identification information for identification of the semiconductor wafer and a check code for checking integrity of the identification information. The controller is capable of reading the identification information and the check code from the second memory area.

Storage device and storage system including a memory to store a check code for an integrity check

Growing community of inventors

Yokohama, Japan

Tatsuro Hitomi