Hitachi, Ltd.

Tatsuo Horiuchi

Mitsugu Sato

Takanori Ninomiya

Kaoru Sakai

Hisae Shibuya

Toshio Asano

Naoto Yoshida

Tadashi Furukawa

Yoshio Yoshiwara

Jun Mochizuki

Goroku Shimoma

Tadanori Takahashi

Atsuo Ohsawa

Keisuke Kawame

Yoshinao Nozaki

Hirofumi Nakatoyodome

Masayuki Yukii

Taiji Kitagawa

A method for evaluating a color picture tube includes displaying on a display surface of a color picture tube a measurement pattern including a plurality of first patterns arranged at different positions relative to fluophor dots of said color picture tube and a plurality of second patterns near said first patterns and sufficiently large relative to said fluophor dots. A first image is obtained using an imaging element to image said displayed measurement pattern. A second image is obtained using said imaging element to image while controlling light intake to allow brightness components of no more than about 1% of maximum luminance from said first image to be separated from noise and imaged. A third image is created by combining said first image and said second image while adjusting scales according to a light intake ratio. From said third image, display center positions of said plurality of first patterns is calculated using said second pattern positions. Discrete fluophor emission intensity distributions is calculated for each of said plurality of first patterns. An electron beam intensity distribution is obtained by matching display center positions of said plurality of first patterns and combining said plurality of first patterns.

Method for evaluating color picture tubes and device for the same and method for making color picture tubes

Method for detecting a defect in a pixel of an electrical display unit and a method for manufacturing an electrical display unit

An electron microscope resolving power evaluation method for evaluating performance of a scanning electron microscope without resorting to visual sensory analysis for minimizing a difference in deterioration with age and in performance among individual scanning electron microscopes. A specimen is prepared by overlaying materials having different emission coefficients of secondary charged particles such as secondary electrons, backscattered electrons, transmitted electrons, etc., a cross-section including an overlaid material part of thin-film layers having known dimensions is mirror-finished, data of a scanning electron microscopical image of the cross-section, including the overlaid material part is obtained, and then the resolving power performance of the scanning electron microscope is evaluated quantitatively by means of frequency analysis, etc.

Resolving power evaluation method and specimen for electron microscope

Growing community of inventors

Chigasaki, Japan

Tatsuo Horiuchi