Hitachi, Ltd.

Hitachi Astemo Ltd.

Tatsuhiko Kawakami

Takeshi Kawamura

Noriyuki Sadaoka

Yukinobu Imamura

Manabu Aoki

Chiharu Tachikawame

Shuichi Tanaka

Provided are a surface inspection device that evaluates a shape of a molded product with high accuracy in a shorter time than in the related art, a shape correction device, a surface inspection method, and a shape correction method. A point measurement sensorthat measures each of positions of predetermined pointsset on a surface of an inspection target; a surface measurement sensorthat measures a shape of a predetermined surfaceincluding the plurality of predetermined pointsby simultaneously measuring positions of a plurality of points of the inspection target; and a deformation amount computation unitthat obtains an amount of deformation of the inspection targetfrom a reference shape based on the positions of the predetermined pointsmeasured by the point measurement sensorand a normal direction of the predetermined surfacemeasured by the surface measurement sensorare included.

Shape correction device and shape correction method based on amount of deformation measured by point measurement sensor and surface measurement sensor

An alternating current loss measuring apparatus for superconductors includes a superconductor specimen, a magnetic field applying coil, a radiation shield, a vacuum vessel, first cooling means, and second cooling means. The first cooling means or the second cooling means is provided with a temperature regulating mechanism. The magnetic field applying means and the radiation shield are set to be a first cooling part, whereas the superconductor specimen is set to be a second cooling part, and the first cooling part and the second cooling part are cooled by first and second cooling means, respectively. A high thermal resistance member is disposed between the superconductor specimen and the second cooling means, and temperature measuring means are disposed at at least two positions on the high thermal resistance member. The alternating current loss of a superconductor under an external magnetic field can be measured at each of different temperatures.

Alternating current loss measuring apparatus

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Tokyo, Japan

Tatsuhiko Kawakami