Seiko Instruments Inc

Seiko Instruments & Electronics Ltd.

Other

Kabushiki Kaisha Daini Seikosha

Sii Nanotechnology Inc.

Masamichi Fujihira

Tatsuaki Ataka

Toshihiko Sakuhara

Hiroshi Muramatsu

Masayuki Suda

Akira Tsugita

Norio Chiba

Koji Iwasa

Kingo Itaya

Kimio Shibayama

Shinobu Toshima

Toyoaki Uchida

Keiji Takamoto

Reiko Irie

Manabu Ooumi

Satoshi Nakayama

Masatoshi Yasutake

Akikazu Odawara

Kazuo Chinone

Akito Ando

Hans W Mewes

Toshihiro Sakuhara

Isamu Arai

A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.

Probe microscope system suitable for observing sample of long body

A part fabricating apparatus has a holder for holding an object to be machined immersed in an electrolytic solution. A machining electrode subjects a surface of the object to an electrochemical reaction to electrolytically machine the surface of the object. The machining electrode has a sharp-edged tip and is coated with an insulator except for the sharp-edged tip. A spacing changing unit detects and changes a spacing between the surface of the object and the machining electrode. A potential/current control unit controls a potential/current on the machining electrode. An electrolytic solution changing unit supplies a first electrolytic solution for subjecting the surface of the object to be machined to a removal process to fabricate a cast mold, supplies a second electrolytic solution for depositing a first metal on a surface of the cast mold to form a first metal layer, and supplies a third electrolytic solution for depositing a second metal inside the cast mold to form a part.

Part fabricating apparatus

An apparatus capable of measuring the topography and the optical characteristics of the surface of a sample at high resolution irrespective of the transmittance and the conductivity of the sample is realized. The apparatus comprises a probe, a light source for illuminating a sample with light, a photoelectric converter device and optics for receiving light transmitted through the sample or light reflected by the sample, a laser emitting laser light for detecting deflections of the probe, a condenser lens for directing the laser light to the rear surface of the probe, a detection system for detecting reflected light, a rough-motion mechanism and a fine-motion mechanism for moving the sample and the probe relative to each other, a control means for controlling the distance between the sample and the probe, and a computer for controlling the whole apparatus. The probe has a front end portion and a light-propagating body continuous with the front end portion. The front end portion and the light-propagating body are shaped like a hook. The apparatus observes the topography and the optical characteristics of the surface of the sample.

Scanning near-field optic/atomic force microscope

A part fabricating method comprises the steps of machining an object to fabricate a part cast mold, depositing a first metal on a surface of the cast mold to form a first metal layer, and depositing a second metal different in kind from the first metal inside the cast mold to form a part. The first metal layer is then selectively removed to take out the part formed inside the cast mold.

Part fabricating method and part fabricating apparatus

A quartz oscillator for detecting a physicochemical change in a substance to be measured comprises a first electrode having at least two separate electrode portions for contact with the substance to be measured, and a second electrode. A chemical measuring instrument comprises a piezoelectric characteristic-measuring circuit having an output signal line connected to capacitors connected in parallel to the separate electrode portions of the first electrode of the quartz oscillator. An input signal line of the piezoelectric characteristic-measuring circuit is connected to the second electrode of the quartz oscillator. A voltage application circuit is connected to one of the separate electrode portions of the first electrode for applying a voltage between the separate electrode portions. An electrical current-measuring circuit is connected to the other of the separate electrode portions which is electrically grounded. The resonant characteristics of the quartz oscillator and the conductivity on the surfaces of the electrodes can be simultaneously and effectively measured.

Instrument for chemical measurement

An electrochemical machining method in which a work piece and a machining electrode are opposed to each other and dipped in an electrolyte solution, and a surface of the work piece is machined by causing an electrolytic reaction between the surface of the work piece and a tip of the machining electrode in a state where a separating distance between the surface of the work piece and the tip of the machining electrode is adjusted and a desired separating distance is maintained, wherein a zero contact reference position where the surface of the work piece and the tip of the machining electrode are brought into contact with each other and the separating distance between the work piece and the machining electrode is nullified is electrically detected, moving distances of the work piece and the machining electrode from the zero contact reference position are detected, a relative separating distance between the surface of the work piece and the tip of the machining electrode is calculated based on a result of the detection and the work piece is machined in a state where the desired separating distance is maintained.

Electrochemical machining method and electrochemical machining equipment

A process is disclosed for sequencing proteins or peptides from the C-terminal end. The process comprises the steps of reacting the peptide or protein with an alkyl acid anhydride to convert the carboxy-terminal thereof into oxazolone, liberating the C-terminal amino acid by reaction with acid and alcohol or with ester, and identifying the liberated amino acid or amino acid derivative.

Method for amino acid sequencing of protein or peptide from carboxy

A protein or peptide which has an amino-terminus serine or threonine which has an acetylated alpha-amino group is allowed to react with an acid, and then allowed to react with an isothiocyanate under acidic conditions to thereby obtain a thiocarbamyl compound. Then the compound is to be analyzed using Edman degradation. Analysis can be performed with fewer operation steps and without using enzymes.

Method for sequencing of protein or peptide

A method for performing fine working of a material by electrochemical reaction comprises a two-step scanning operation in which a surface topography of the material is obtained during a first scan which is used to control the position of a probe during a second scan in which an electrochemical reaction is performed. During the first scan, an electrochemical cell is constructed with a four-electrode system, including the probe, a material to be worked, a reference electrode and a counter electrode. The potential of each of the probe and the material to be worked is set so that no electrochemical reaction occurs during the first scan. Data representative of the surface topography is stored and used to control the position of the probe during the second scan in which an electrochemical cell is constructed with a three-electrode system, including the probe, the material, and the reference electrode. The potential of the material with respect to the probe is set such that the electrochemical reaction occurs during the second scan, and the probe is maintained at a distance determined based on the stored topographical data.

Method and apparatus for performing fine working

A process for synthesizing iron(III) hexacyanoferrate(II) as a blue insoluble product on the surface of a working electrode is disclosed which comprises immersing a pair of electrodes in a solution mixture of an iron(III) ion-containing solution and a hexacyanoferrate(III) ion-containing solution and effecting electrolysis with one of the electrodes as an anode and the other as a cathode, whereby iron(III) hexacyanoferrate(II) is deposited on the surface of the cathode.

Film of iron (III) hexacyanoferrate (II) and process of synthesizing same

In order to enhance the sensitivity of a nondestructive testing system, a pair of superconducting coils are disposed in the same plane such that a current flowing through the respective coils when exposed to a uniform magnetic field cancels out. As a result of this configuration, the detection coils are immune to noise, offset fields or other uniform ambient phenomena. In one embodiment, the nondestructive testing unit includes a plurality of detection coils, a SQUID having a pair of connectors for connection to the detection coils, a probe for supporting the detection coils and the SQUID in a coolant, a cryostat for supporting the probe and for keeping the coolant constant, a controller for processing a signal transmitted from the SQUID, and a display device for displaying the result of the processing. At least two detection coils are disposed in the same plane, are directly connected to the SQUID and are integrated on a semiconductor substrate.

Nondestructive testing system using a SQUID

A method of forming a mask for photolithography comprises forming a transparent conductive film on a transparent substrate. The substrate and an electrode having a sharp front end are immersed in an electrolytic solution. The sharp front end of the electrode and the transparent film are then positioned close to each other while controlling a distance therebetween. The substrate and the electrode are then scanned relative to each other in two-dimensions while maintaining the distance between the sharp front end of the electrode and the transparent film constant. Thereafter, an electrochemical reaction is processed on the substrate while a voltage is applied between the transparent film and the electrode to form a mask pattern on the substrate. During repair of the mask thus formed, the substrate and the electrode are immersed in the electrolytic solution. The sharp front end of the electrode and a portion of the mask pattern to be repaired are positioned close to one another, and a distance between the sharp front end of the electrode and the mask pattern is controlled by detecting a tunnelling current flowing therebetween. Thereafter, a voltage is applied between the electrode and the mask pattern to either deposit a pattern material onto the portion of the mask pattern to be repaired or to dissolve a pattern material from the portion of the substrate pattern to be repaired.

Method of forming and repairing a mask for photolithography

There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole. Further, information is written and read with high density less than the wavelength of light using an apparatus for writing to and reading from an optical memory piezoelectric medium comprising the optical memory piezoelectric medium constituted by a piezoelectric element modified on the surface thereof by a photolytic residual group, an optical probe having a microscopic aperture on the leading end thereof, a light source, an X-Y-Z position control means, a means for measuring the resonance characteristics of the piezoelectric element and a controller for controlling the apparatus as a whole.

Optical memory medium

Optical information read/write apparatus

An optical scan type tunnel microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and an optical detecting system 15.

Growing community of inventors

Chiba, Japan

Tatsuaki Ataka