Seiko Instruments Inc

Ablic Inc.

Sii Semiconductor Corporation

Taro Yamasaki

Fumiyasu Utsunomiya

Isamu Fujii

Sadashi Shimoda

Masanori Miyagi

Yusuke Takeuchi

There is provided a wireless control system which has a node apparatus including a power generating device, a capacitor and a voltage conversion circuit device connected to the power generating device, and a wireless device having a transmitter function, and connected to the voltage conversion circuit device; a gateway device having a transceiver function of transmitting and receiving a wireless signal transmitted from the node apparatus; and a server device connected to the gateway device, and further has a receiving device which receives a signal transmitted from the gateway device having the transceiver function, and an actuator operated by a signal sent from the receiving device, and in which power with which the node apparatus operates is supplied from the power generating device, and the power generated in the power generating device is increased and decreased by the actuator.

Wireless control system initiated by power generation

Provided is a non-volatile semiconductor storage device which can be downsized with a simple circuit without impairing the function of an error correcting section, and a method of testing the non-volatile semiconductor storage device. An error correction circuit is configured to perform error detection and correction of merely the same number of bits as data bits, and a circuit for performing error detection and correction of check bits is omitted to downsize the circuit. A multiplexer for, in a testing state, replacing a part of the data bits read out from a storage element array with the check bits, and inputting the check bits to the error correction circuit is provided. Thus, error detection and correction of the check bits are performed to enable shipment inspection concerning the check bits as well.

Non-volatile semiconductor storage device and method of testing the same

The voltage reference circuit includes: a first MOS transistor; a second MOS transistor including a gate terminal connected to a gate terminal of the first MOS transistor and having an absolute value of a threshold value and a K value higher than an absolute value of a threshold value and a K value of the first MOS transistor; a current mirror circuit flowing a current based on a difference between the absolute values of the threshold values of the first MOS transistor and the second MOS transistor; a third MOS transistor flowing the current; and a fourth MOS transistor having an absolute value of a threshold value and a K value higher than an absolute value of a threshold value of the third MOS transistor and flowing the current.

Constant output reference voltage circuit

Provided is a proximity sensor using a photosensor, which is easy to use and reduced in power consumption. In the proximity sensor, a first photosensor is used to detect a change in amount of ambient light entering the first photosensor, which is caused when a finger is coming close thereto, and a detection signal is output based on a result of the detection. The photosensor includes, for example, one or a plurality of PN junction elements connected in parallel.

Proximity sensor using photosensor

A nonvolatile semiconductor memory device, having a booster circuit capable of performing a boost operation with appropriate boost voltage arrival time without increasing the circuit size. The nonvolatile semiconductor memory device includes a timing generator circuit and a current load circuit which applies a current load to an output of a booster unit according to a signal from the timing generator circuit, thereby achieving an appropriate boost voltage arrival time by using the current load circuit in concert with the operation of erasing or writing on memory cells.

Nonvolatile semiconductor memory device

Provided is a light receiving circuit for detecting a change in amount of light, in which an input circuit at a subsequent stage is compact and inexpensive and current consumption is low. The light receiving circuit includes: a photoelectric conversion element for supplying a current corresponding to an amount of incident light; an N-channel MOS transistor including a drain supplied with the current from the photoelectric conversion element; and a control circuit for controlling a gate voltage of the NMOS transistor via a low pass filter so that a drain voltage of the N-channel MOS transistor becomes a desired voltage. The control circuit outputs a control state output signal, which is a GND terminal voltage when a delay amount of control on the gate voltage of the NMOS transistor performed via the low pass filter is less than a desired delay amount, and is the drain voltage of the NMOS transistor when the delay amount of control on the gate voltage of the NMOS transistor performed via the low pass filter is the desired delay amount or more. The light receiving circuit outputs the control state output signal as an output signal.

Growing community of inventors

Chiba, Japan

Taro Yamasaki