Mstar Semiconductor, Inc.

Shanghai Ic R&d Center Co., Ltd

Chengdu Image Design Technology Co., Ltd.

Rda Microelectronics (shanghai) Co., Ltd.

Tao Zhou

Pengfei Wang

Jiebin Duan

Chen Bo Li

Hao Fu

Lingyi Guo

Yan Yan

Xueru Yu

Xiucui Wang

Liren Li

Yiwei Song

Chen Li

Bowen Xu

Hongxia Sun

The present disclosure provides an audio amplifying circuit and a playing device, including: N-order filters and an integrated circuit; after an original audio signal passes through the N-order filters, a filtered signal is obtained; after the filtered signal passes through the integrated circuit, a corresponding digital signal is output; where the number of operational amplifiers adopted in the N-order filters is smaller than N, and N is a natural number greater than 1.

Audio amplifying circuit and playing device

The present invention disclosures a critical dimension error analysis method, comprising: S: performing lithography processes on a wafer, measuring the critical dimension (CD) values of the test points in each of the fields respectively; M and N are integers greater than 1; S: removing extreme outliers from the critical dimension (CD) values; S: rebuilding remaining CD values by a reconstruction model fitting method, and obtaining rebuilt critical dimension (CD″) values, according to relative error between CD″ and CD, dividing the rebuilt critical dimension (CD″) values into scenes and the number of the scenes is A; S: calculating components and corresponding residuals of the test points in each of the scenes under a reference system corresponding to a correction model by parameter estimation; S: modifying machine parameters and masks by the correction model according to above calculation results. The present invention uses an outer limit to remove extreme outliers, so as to analyze a critical dimension error during a lithography process quickly and accurately.

Critical dimension error analysis method

The present invention discloses an image sensor for real-time calibration of dark current, including a pixel array comprises at least a pixel unit, the pixel unit includes a pixel photosensitive portion, a pixel dark shielding portion and a subtraction circuit, photodiodes in the pixel photosensitive portion and the pixel dark shielding portion are isolated by deep trench isolations, the pixel dark shielding portion are covered by a dark shielding layer; both of the pixel photosensitive portion and the pixel dark shielding portion adopt a same voltage and sequential control, a light ambient voltage signal and a non-light ambient voltage signal are generated and connected to both ends of a subtraction circuit to realize subtraction and dark current calibration. The present invention discloses an image sensor for real-time calibration of dark current, which can make the dark current calibration completed directly within the pixel, and can better cover the dark pixel part, so as to make calibration value of dark current and dark noise more accurate.

Image sensor for real time calibration of dark current and calibration method

A method for error tracking a log subsystem of a file system is provided. The method includes: when a data block of the log subsystem is recovered to an original position in the file system, calculating a verification code of the data block to obtain a second verification code; determining whether a verification result between the second verification code and a first verification code of the data block stored in a spare space in a submit block of the log subsystem in a disk is consistent; and when the verification result is inconsistent, processing the data block corresponding to the inconsistent verification result. With the above method, given that system performance is least affected, an error and a position of the error of the log subsystem of the file system can be more accurately detected to enhance the reliability of the log subsystem.

Method and processor for writing and error tracking in a log subsystem of a file system

A method for processing burn data of NAND flash is provided. The method includes: identifying all half-empty blocks in the burn data of the NAND flash, the half-empty blocks being blocks in which a part of pages are written with data and the remaining part of pages being blank pages; writing a predetermined label character to all the blank pages of the all the half-empty blocks to convert the half-empty blocks to full blocks. With the above approach, the present invention fulfills the requirement that every page is either empty or written with data, so as to prevent from damaging data in a high-temperature patching process to thereby enhance product quality and reliability.

Method, device and operating system for processing and using burn data of NAND flash

A repair method for an abnormal-erase memory block of a non-volatile flash memory is provided. The method includes steps of: sequentially scanning bit data in a page of a block when reading data in a NAND flash; determining whether the page is an abnormal-erase page; setting logic '0' bit data in the page to logic '1' when the page is an abnormal-erase page; and re-erasing the block.

Repair method and device for abnormal-erase memory block of non-volatile flash memory

A pilot process method for system boot and an associated are provided. An environment variable is read from a NAND flash memory. When an irrevocable error exists in an environment variable, the environment variable is read successively for a predetermined threshold number of times. A backup variable of the environment variable is read when the irrevocable error is still present in the environment variable that is read for a predetermined threshold number of times, and the environment variable is restored according to the backup variable. Therefore, when it is confirmed that the environment variable is damaged, a backup variable is utilized and the damaged environment variable is restored according to the backup variable, so as to ensure a normal boot-up process of the system to significantly enhance system reliability as well as user experience.

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Shanghai, China

Tao Zhou