Taiwan Semiconductor Manufacturing Comp. Ltd.

Tan-Li Chou

Yun-Han Lee

Lee-Chung Lu

Chung-Hsing Wang

Kuo-Nan Yang

Mill-Jer Wang

Huang-Yu Chen

Wei-Li Chen

Shyh-Horng Yang

Jhong-Sheng Wang

Chung-Kai Lin

Shou-En Liu

Shi-Hung Wang

Ya Chen Wang

Kheng-Guan Tan

A method of designing integrated circuits includes forming a restricted cell library from a first cell library by selecting only those cells in the first cell library that are most efficient according to predetermined efficiency criteria and executing an integrated circuit design operation in an electronic design automation program while directing the electronic design automation program to make cell selections exclusively from the restricted cell library. The integrated circuit design operation is one that can be directed to make cell selections from any of the cells in the first cell library without changing its essential purpose. The method improves QoR for the resulting circuit design.

Promoting efficient cell usage to boost QoR in automated design

A method of designing a circuit includes receiving a circuit design, and determining a temperature change of at least on back end of line (BEOL) element of the circuit design. The method further includes identifying at least one isothermal region within the circuit design; and determining, using a processor, a temperature increase of at least one front end of line (FEOL) device within the at least one isothermal region. The method further includes combining the temperature change of the at least one BEOL element with the temperature change of the at least one FEOL device, and comparing the combined temperature change with a threshold value.

Method of designing a circuit and system for implementing the method

A probe card includes a plurality of probe pins, and a switch network connected to the plurality of probe pins. The switch network is configured to connect the plurality of probe pins in a first pattern, and reconnect the plurality of probe pins in a second pattern different from the first pattern.

Test schemes and apparatus for passive interposers

The present application discloses a method of generating an intellectual property (IP) block design kit including an IP block circuit design and a system-level characteristics table for manufacturing an integrated circuit. According at least one embodiment, the IP block circuit design is generated. The IP block circuit design is simulated based on predetermined configuration sets, and each configuration set has manufacturing options and/or operating conditions. A plurality of system-level models for the predetermined configuration sets are generated based on the simulation of the IP block circuit design. The system-level characteristics table is generated by arranging the predetermined configuration sets and the system-level models in compliance with a system-level characteristics table template of a system-level characteristics modeling device. Then the IP block circuit design and the system-level characteristics table are stored as the IP block design kit.

Method of generating an intellectual property block design kit, method of generating an integrated circuit design, and simulation system for the integrated circuit design

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Zhubei, Taiwan

Tan-Li Chou