Fuji Electric Co., Ltd.

Tamiko Asano

Michio Tamate

Ryu Araki

Miwako Fujita

Yuhei Suzuki

Tadanori Yamada

Hiroki Katsumata

Takashi Kaimi

Bao Cong Hiu

Yuta Sunasaka

Provided is a semiconductor module having a P-side arm circuit and an N-side arm circuit. The semiconductor module comprises: a P terminal on a high-voltage side; an N terminal on a low-voltage side; a plurality of wiring patterns separated from each other; and a transistor and a diode connected in parallel in each of the circuits, wherein the plurality of wiring patterns include a first wiring pattern, a second wiring pattern, and a third wiring pattern, the P terminal is connected to the first wiring pattern, the N terminal is connected to the second wiring pattern, an anode electrode of the diode of the N-side arm circuit is arranged above the second wiring pattern and is connected to the second wiring pattern, and an anode electrode of the diode of the P-side arm circuit is arranged above the third wiring pattern and is connected to the third wiring pattern.

Semiconductor module

The electromagnetic noise of a semiconductor device is conveniently evaluated, and the electromagnetic noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method is provided which includes causing one of a first device and a second device of a semiconductor device to perform a switching operation, the semiconductor device comprising the first device and second device connected in series and a third device and a fourth device connected to each other in series and connected parallel to a series circuit of the first device and second device; measuring voltage variation occurring between the third device and the fourth device during the switching operation; and outputting an evaluation benchmark for electromagnetic noise of the semiconductor device, based on the voltage variation.

Evaluation method, estimation method, evaluation apparatus, and combined evaluation apparatus

The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method including: making a semiconductor device that is connected parallel to a load by a load cable, perform a switching operation; measuring common-mode current flowing through the load cable during the switching operation; and outputting an evaluation benchmark for radiated noise based on the common-mode current, and an evaluation apparatus are provided.

Evaluation method, combined evaluation method, evaluation apparatus, and combined evaluation apparatus

The radiated noise of a semiconductor device is conveniently evaluated, and the radiated noise of an apparatus equipped with the semiconductor device is estimated. An evaluation method and an evaluation apparatus are provided, including: causing a semiconductor device to perform a switching operation; measuring voltage variation occurring between main terminals of the semiconductor device during the switching operation; and outputting an evaluation benchmark for radiated noise of the semiconductor device based on the voltage variation. The outputting the evaluation benchmark may include calculating the voltage variation in the semiconductor device for each frequency component as the evaluation benchmark.

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Hino, Japan

Tamiko Asano