Ricoh Company, Ltd.

Tami Isobe

Kiyoshi Yokomori

Magane Aoki

Shigeyoshi Misawa

Syunsuke Fujita

Hiroyoshi Funato

Yoshinobu Nakayama

Takao Saka

Tsuyoshi Nakayama

An authentication server receives user information from an MFP, and acquires information on a service available for the user. The authentication server creates information on a menu screen having a selection function of selecting the service available for the user based on the acquired service information. The MFP receives the customized menu screen provided from the authentication server, and displays the menu screen on a display device.

Image processing system, image managing device, method, storage medium and image processing device

In an apparatus for recording and reading out magnetooptic information an incident light beam polarized in a predetermined direction is modulated by rotating a plane of polarization in accordance with a recording pattern of a magnetooptic information recording medium utilizing magnetooptic Kerr effects. The modulated light beam is detected by a detecting system integrated element to read the recording pattern. The magnetooptic information recording-reading out apparatus has a TE/TM mode separating element of a waveguide type for separating lights in TE and TM modes from each other and disposed in the detecting system integrated element; a waveguide photodetector for detecting light in the TE mode and disposed in the detecting system integrated element; a waveguide photodetector for detecting light in the TM mode and disposed in the detecting system integrated element; and a signal detector for setting outputs I.sub.TE and I.sub.TM of the waveguide photodetectors for detecting lights in the TE and TM modes to be approximately equal to each other.

Magnetooptic apparatus with integrated detecting element providing

In method and apparatus for measuring a refractive index and a thickness of a thin film formed on a substrate, the thin film has m (m.gtoreq.1) layers and a transparent uppermost layer is set as a first layer. A total of (3m+1) parameters include a refractive index n(0) of an incident medium, a refractive index n(j) (j=1 to m) of a j-th layer, absorption coefficients k(j) (j=2 to m) of second to m-th layers, a refractive index n(m+1) and an absorption coefficient k(m+1) of the substrate, and thicknesses d(j) (j=2 to m) of the second to m-th layers. Arbitrary one of the (3m+1) parameters is unknown and the other 3m parameters are known. This method and apparatus measure the unknown parameter. Monochromatic light having a wavelength is incident to the film having the m-layers at a predetermined incident angle from a first layer side in the incident medium to measure reflectances about S and P polarized light. A function of the unknown parameter is specified using measured values of the reflectances, the wavelength and 3m known parameters. An equation about this function is numerically solved to determine the unknown parameter.

Method for measuring refractive index and thickness of film and

An apparatus for recording and reproducing optical information includes an optical integration detecting element arranged on an optical path of light from a laser beam source to an optical information recording medium. The optical integration detecting element has an optical waveguide layer formed on a substrate; a photodetector connected to the optical waveguide layer; a first gap layer formed on the optical waveguide layer and having a refractive index lower than that of the optical waveguide layer; a second gap layer formed on the first gap layer and having an opening portion and a refractive index lower than that of the optical waveguide layer; an adhesive layer having a refractive index higher than that of the optical waveguide layer and adhered to the first gap layer such that the opening portion of the second gap layer is filled with the adhesive layer; and a prism adhesively fixed to an upper portion of the adhesive layer and constructed by a dielectric substance having a refractive index higher than that of the optical waveguide layer.

Apparatus for recording and reproducing optical information and prism

A magneto-optical signal detection device comprising a thin film type optical waveguide unit having a substrate on which a waveguide is formed. The unit has a coupling portion for coupling two polarization components simultaneously in a same plane of the waveguide as a TE mode and a TM mode. The modes TE and TM are included in reflection light reflected from a magneto-optical recording medium and perpendicular to each other. The unit also has a TE-TM mode separating portion having a taper boundary. A waveguide layer is gradually thinned in the taper boundary toward an outer end thereof.

Mode splitter and magneto-optical signal detection device

A high efficiency prism coupling device that comprises a substrate, an optical waveguide layer disposed on the substrate, a gap adjuster layer disposed on the waveguide layer and a prism secured to the gap adjuster layer through a dielectric adhesive agent. The gap adjuster layer has a refractive index which is lower than that of the waveguide layer. The gap adjuster layer has a recess formed therein for guiding an incident beam to the waveguide layer through a bottom portion thereof. The adhesive agent is disposed in and around the recess and has a refractive index which is higher than that of the waveguide layer. The prism is made from a dielectric material and disposed above the recess of the gap adjuster layer through the adhesive agent. The prism has a refractive index which is higher than that of the waveguide layer. The incident beam is introduced from outside through the prism, the adhesive agent and the bottom portion of the recess to the waveguide layer.

High efficiency prism coupling device and method for producing the same

A method for measuring an unknown parameter, such as a refractive index, absorption coefficient and film thickness of the uppermost layer of a multi-layered film formed on a substrate whose refractive index and absorption coefficient are known, the refractive index, absorption coefficient, and film thickness of the other layer or layers than the uppermost layer on the multi-layered film being known, and at least one of the refractive index n.sub.1, absorption coefficient k.sub.1 and film thickness d.sub.1 of the uppermost layer being unknown, includes the step of measuring the reflectances, the step of specifying the functions containing unknown parameters, and the step of numerically solving the equation.

Method for measuring an unknown parameter of a thin film and apparatus

A method for measuring refractive index of a thin film layer formed on the other layer having a known refractive index includes following steps. A step of irradiating P-polarized monochromatic light and S-polarized monochromatic light individually on the thin film layer with a prescribed angle of incidence, a step of determining reflectances R.sub.p and R.sub.s for the P-polarized monochromatic light and S-polarized monochromatic light, respectively, by detecting luminous intensity of reflected light from the thin film layer, and a step of specifying the refractive index of the thin film layer by prescribed calculation either using the amount of phase changes produced by reflection of said P-polarized light and S-polarized light on a boundary surface between the thin film layer and the medium, the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and R.sub.s, or using the amount of phase changes of lights during propagation from an upper surface of the thin film layer to a lower surface thereof the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and R.sub.s.

Method for measuring refractive index of thin film layer

A method for measuring refractive index of a thin film layer formed on the other layer having a known refractive index includes following steps. A step of irradiating P-polarized monochromatic light and S-polarized monochromatic light individually on the thin film layer with a prescribed angle of incidence, a step of determining reflections R.sub.p and R.sub.s for the P-polarized monochromatic light and S-polarized monochromatic light, respectively, by detecting luminous intensity of reflected light from the thin film layer, and a step of specifying the refractive index of the thin film layer by prescribed calculation either using the amount of phase changes produced by the reflection of said P-polarized light and S-polarized light on a boundary surface between the thin film layer and the medium, the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and Rs, or using the amount of phase changes of lights during propagation from an upper surface of the thin film layer to a lower surface thereof the phase changes being determined in accordance with the refractive index of the medium and the reflectances R.sub.p and R.sub.s.

Method and apparatus for measuring refractive index and thickness of film

A method for determining a measured incident angle of a monochromatic light for measurement is applied in the measurement of a refractive index and a thickness of a thin film of a single layer formed on a substrate having a known complex refractive index. This method comprises the steps of measuring a first energy reflection ratio of an S-polarized light or a P-polarized light by a measured sample at various angles of incident of the monochromatic light having a certain wavelength used in the measurement; calculating a second energy reflection ratio of the S-polarized light or the P-polarized light when the monochromatic light is incident to the substrate within an incident medium having a certain refractive index, the second energy reflection ratio being calculated by using the complex refractive index and the refractive index of the incident medium as a function of the incident angle; calculating a second angle satisfying an equation in which the first and second reflection ratios are equal to each other with respect to the S-polarized light or the P-polarized light; and setting an angle except for this second angle as the measured incident angle. The other two incident angle determining methods are shown.

Method for determining incident angle in measurement of refractive index

An optical waveguide device which comprises a substrate, an optical waveguide layer formed on the substrate, a gap adjusting layer formed on the optical waveguide layer, a metallic layer formed on the gap adjusting layer to partly cover the gap adjusting layer and having an opening therein, a dielectric adhesive layer disposed in contact with the gap adjusting layer through the opening of the metallic layer, and a dielectric prism disposed on the adhesive layer. The gap adjusting layer has an index of refraction which is lower than that of the optical waveguide layer. An incident light passes through the opeining of the metallic layer. The dielectric adhesive layer has an index of refraction which is higher than that of the optical waveguide layer. The dielectric prism has an index of refraction which is higher than that of the optical waveguide layer.

Optical waveguide device

An optical waveguide device includes an optical waveguide extending straight over a predetermined length, a metal cover layer formed on the optical waveguide at least partly and formed with an opening extending therethrough, and a prism fixedly attached to the metal cover film covering the opening. The prism has an index of refraction higher than that of the optical waveguide and the prism receives an incoming light beam and causes the light beam thus received to be coupled into the optical waveguide through the opening. The device may include a substrate on which the optical waveguide is formed with or without a buffer layer therebetween. A photodetector may also be formed integrally with the optical waveguide at one end thereof for detecting light coupled into and propagating along the optical waveguide. Such a device including a photodetector may be used as an optical component of an optical pick-up for use in an optical information recording and reproducing system.

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Yokohama, Japan

Tami Isobe