Palantir Technologies Inc.

Tam-Sanh Nguyen

Thomas Powell

Myles Scolnick

Andre Frederico Cavalheiro Menck

Bianca Rahill-Marier

Steven Fackler

Jim Inoue

William Seaton

Andrew Poh

Maciej Albin

Benjamin Lee

Paul Gribelyuk

Jonah Scheinerman

Benjamin Grabham

Arion Sprague

Gregoire Omont

Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.

Systems and methods for determining relationships between defects

Growing community of inventors

Olney, MD, United States of America

Tam-Sanh Nguyen