Semiconductor Energy Laboratory Co., Ltd.

Takuya Kimishima

Hajime Kimura

Shunpei Yamazaki

Yasuyuki Arai

Atsushi Umezaki

Hideaki Shishido

Yasunori Yoshida

In a display element such as an organic EL element, deterioration progresses due to light emission, and emission luminance is lowered even if the same voltage is applied to the display element. Therefore, use over time causes variations in luminance of each pixel, thereby a so-called 'image burn-in' phenomenon occurs. Given this factor, the invention provides a display device which can reduce the difference in deterioration of a display element in each pixel and suppress variations in light emission of a display element in a pixel. It is prevented that only a specific pixel has a long accumulated lighting time. For that purpose, a gray scale of a display pattern is changed to prevent the difference in deterioration of display element in pixels from increasing. Alternatively, a specific display pattern is prevented from being fixedly displayed in a specific region. Further alternatively, a pixel lagging behind in deterioration is deteriorated so that the accumulated lighting time of pixels is equal to each other.

Display device

To constitute a display panel only by transistors having the same conductivity type is difficult if a p-type transistor is adopted as a driving transistor. By constituting a circuit formed in the display panel by transistors having the same conductivity type, manufacturing process can be reduced, and cost reduction can be achieved. In the invention, an n-type transistor is used as a driving transistor for driving a light emitting element, and the driving transistor and the light emitting element constitute a source follower circuit.

Display device and driving method thereof, semiconductor device, and electronic apparatus

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Kanagawa, Japan

Takuya Kimishima