Keyence Corporation

Kerence Corporation

Takuya Karube

Masaki Fujiwara

Masahiro Inomata

Suguru Sekiya

Jun Tabuchi

Shunsuke Tanaka

Norio Shibata

Yoichi Okamoto

A three-dimensional shape measuring apparatus includes a stage that includes a translation stage part having a placement surface on which a measurement object is placed and capable of translating the placement surface; an illuminator that includes independently controllable and two-dimensionally-arranged projection devices, and illuminates the measurement object, which is placed on the stage, with measuring light having a predetermined projection pattern having alternating light-and-dark intervals; a photoreceptor that receives measuring light reflected by the measurement object illuminated by the illuminator, and to generate a projection pattern image; and a movement controller that controls the translational movement of the translation stage part by a moving pitch smaller than the minimum width of the projection pattern which can be projected on the stage by independently controlling the projection devices of the illuminator.

Three-dimensional shape measuring apparatus, three-dimensional shape measuring method, three-dimensional shape measuring computer-readable storage medium, and three-dimensional shape measuring computer-readable storage device

When acquiring a navigation image, to make it possible to set conditions the same as conditions under which a navigation image is acquired last time and create a natural navigation image. A navigation-image acquiring section controls a placement-table control section on the basis of designation of addition of a region to a navigation image and, when present imaging conditions are different from the last imaging conditions, changes the imaging conditions to the last imaging conditions, acquires a region to be added with an imaging element, and causes a display section to display an image of the acquired region to be added and an existing navigation image.

Magnifying observation apparatus

The present invention is for saving the time of searching a visual field to be observed and observing a synthetic image. A magnifying observation apparatus includes a controller configured to set an imaging condition, to generate a first image to be displayed in a first display mode by performing a first image processing on the image acquired on the imaging condition, to generate a second image to be displayed in a second display mode by performing a second image processing on the image, to detect an image changing operation including at least one of changing of the imaging condition and changing of a visual field, and to switch from the first display mode to the second display mode in response to detect the image changing operation.

Magnifying observation apparatus, magnified image observing method and computer-readable recording medium

A synthetic image can be generated by a simple operation in a short time. A magnifying observation apparatus includes: a z-axis movement unit capable of automatically adjusting a working distance to an observation surface of an observation target placed on a placement section; an xy-axis movement mechanism capable of changing relative positions of the placement section and a microscope lens section; and an image synthesizing unit for generating a synthetic image obtained by synthesizing a plurality of images each captured at a relative distance made different by the z-axis movement unit, wherein image synthesis processing by the image synthesizing unit and processing of moving the microscope lens section by the z-axis movement unit and capturing an image by the camera section are asynchronously executed.

To provide a microscope system capable of automatically detecting a position of a focus of an optical system relative to an observing object. A light emitted from a laser light source is irradiated on an observing object, and the light reflected by the observing object is guided to a light receiving element. An evaluation value based on a plurality of pixel data is set so as to be smaller than an output upper limit value Emax and greater than a multiplication value Enof a noise level. The evaluation value is calculated with the set gain while moving the objective lens in an upward direction from a current position zs. The gain is reduced by a constant amount every time the evaluation value reaches the output upper limit value Emax. The position in the Z direction of the objective lens when the evaluation value becomes a peak is detected.

Microscope system, focus position detection method, and focus position detection program

To provide a microscope system enabling the user to accurately observe the surface of the observing target in a short time. A sensitivity parameter for adjusting a value of the pixel data corresponding to a plurality of pixels is set. The pixel data is acquired with a first sensitivity value set as the sensitivity parameter, and the number of pixels in which the peak value of the pixel data is smaller than or equal to a threshold value is detected. A ratio of the detected number of pixels with respect to the total number of pixels region is calculated, where the pixel data is acquired by a second sensitivity value different from the first sensitivity value when the ratio is greater than or equal to a reference value, and the pixel data is not acquired by the second sensitivity value when the ratio is smaller than the reference value.

Growing community of inventors

Osaka, Japan

Takuya Karube