Konica Minolta, Inc.

Takushi Uda

Takashi Kawasaki

Kenji Konno

Yoshitaka Teraoka

Syogo Mochida

Provided are an optical system for measuring optical characteristics and a device for measuring optical characteristics capable of acquiring a two-dimensional image close to visual observation in addition to measurement of optical characteristics of a measurement target. The optical system for measuring optical characteristics includes a first optical system () that captures an infinite conjugate image and a second optical system () that captures a conjugate image of a measurement target. The first optical system () and the second optical system () sharing a first lens group (G) are arranged on two optical axes separated by an optical element () that deflects an optical axis, respectively, and are configured as one measuring optical system. Furthermore, an aperture stop of the second optical system () is arranged in the vicinity of an intermediate image. When a distance in an optical axis direction from an image side paraxial focal point of the first lens group (G) to the aperture stop is represented by Δp, and a focal distance of the first lens group is represented by f1, Δp/f1 satisfies −1.0<Δp/f1<3.0.

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Osaka, Japan

Takushi Uda