Hamamatsu-Photonics K.k.

The University of Tokyo

Takuo Tanemura

Yoshiro Nomoto

Go Soma

Taichiro Fukui

Hiroki Miyano

A light modulator includes a base layer, a metal reflective layer formed on the base layer, a modulation layer of a nonlinear optical crystal formed on the reflective layer, and a conductive pattern layer including a plurality of pattern portions arranged periodically in a first direction and each extending in a second direction, and formed on the modulation layer. The modulation layer changes a reflectance for object light by changing a refractive index when a voltage is applied between the reflective layer and the conductive pattern layer. The light modulator outputs the object light being incident from an upper surface side of the modulation layer, transmitted through the modulation layer, and reflected by the reflective layer to the outside as modulated light with an intensity modulated by the reflectance change.

Light modulator and light modulator array

A light modulator includes a base layer made of an insulating material having a transmitting property for object light, a conductive pattern layer made of a conductive material, including a plurality of pattern portions arranged periodically, and formed on the base layer, a modulation layer made of an electro-optic polymer, filling a space between the plurality of pattern portions and formed on the conductive pattern layer, and having a refractive index to be changed by applying an electric field, and a reflection layer formed on the modulation layer and reflecting the object light incident from a lower surface of the base layer and transmitted through the modulation layer, and the object light having a phase modulated by being transmitted through the modulation layer and reflected by the reflection layer is output from the lower surface of the base layer to the outside as modulated light.

Optical modulator and optical modulator array

An optical property evaluation apparatus evaluates an optical property of an evaluation object, and includes a light source, a polarization beam splitter, a polarization adjuster, a first detector, a second detector, and an analyzer. The analyzer obtains a reflectance when linearly polarized light in a specific direction is incident on the evaluation object based on the detection result by the first detector when the light with which the evaluation object is irradiated is set to be the linearly polarized light in the specific direction. The analyzer obtains a phase property at the reflection of the evaluation object based on the detection result by the first detector or the second detector when the light with which the evaluation object is irradiated is set to have a polarization state different from the linearly polarized light in the specific direction, and a Jones matrix.

Growing community of inventors

Tokyo, Japan

Takuo Tanemura