Horiba, Ltd.

Takuji Oida

Shigeyuki Akiyama

Masahiko Fujiwara

Naohito Shimizu

Satoshi Inoue

Masahiko Endo

Yusuke Mizuno

Toshikazu Ohnishi

Takuya Ido

Shuji Takada

Aritoshi Yoneda

Makoto Matsuhama

Tomoko Seko

Hiroshi Mizutani

Atsushi Yamamoto

Misato Arakawa

Norikazu Iwata

A gas analyzing apparatus includes a gas analyzing unit, a luminescence inducing component generating unit, and a measurement signal calculating unit. The gas analyzing unit receives a sample gas containing a component gas and/or a standard gas and the luminescence inducing gas. The gas analyzing unit is configured to output a detection signal based on an intensity of a reaction light generated by the interaction between the component gas and the luminescence inducing component. The luminescence inducing component generating unit generates the luminescence inducing gas by electric discharge generated repeatedly at specified intervals. The measurement signal calculating unit calculates a first measurement signal based on a first detection signal, based on the reaction light generated when the sample gas and the luminescence inducing gas are introduced, and a second detection signal, based on the reaction light generated when the standard gas and the luminescence inducing gas are introduced.

Gas analyzing apparatus

A gas concentration measuring apparatus for measuring a concentration of a measurement target substance contained in a sample gas includes a light source unit in which a light source is arranged, and a sensor unit that is arranged on an optical path of the light source. The sensor unit includes a concentration measuring sensor configured to receive light from the light source after the light has passed through a sample cell unit and measure a concentration of the measurement target substance. The apparatus further includes an introducing device configured to introduce the sample gas to a vicinity of concentration measuring sensor. Therefore, a vicinity of the concentration measuring sensor is filled with an atmosphere of the sample gas so that a concentration of a measurement target substance contained in the sample gas is measured stably and accurately regardless of fluctuations in an ambient atmosphere of a measuring environment.

Gas concentration measuring apparatus

The measurement sensitivity is improved by suppressing the surrounding temperature influence as much as possible, while realizing scale reduction, and by enlarging the detection signal, while reducing the production errors in enclosing a reference gas. Provided is a thermal conductivity sensor that detects thermal conductivity of a sample gas by using a Wheatstone Bridge circuit constructed in such a manner that measurement resistors that are brought into contact with the sample gas are disposed on a first side, and reference resistors that are brought into contact with a reference gas are disposed on a second side, and comparing the potential difference between connection points of the reference resistors and the measurement resistors. The measurement resistors disposed on the first side are assembled in one measurement space, and the reference resistors disposed on the second side are assembled in one reference space.

Thermal conductivity sensor

A stack-gas measuring apparatus includes a sample introducing unit (sampling unit and heating conduit pipe) for introducing stack-gas, a cooling unit (containing wet filter) in which dust components in the stack-gas are agglomerated, a filter column containing a filter element made of a polymer material for collecting the dust components, a mist scrubber which is disposed downstream of the filter column and which contains an adsorbent for removing acid mist in the stack-gas, and an analyzer in which the cleaning-processed gas is introduced to measure a particular component in the stack-gas.

Stack-gas measuring apparatus and stack-gas measuring method

This invention relates to a multi-component absorbance monitor, and the object is to provide a general-purpose and highly accurate compact absorbance monitor. Disclosed is an absorbance monitor including a light source, a sample cell and a plurality of detectors as elements, wherein a light collecting member is arranged between the light source and one detector, and an inside wall of the light collecting member has a site for guiding a part of light from the light source, that is, a light guiding opening, and light from the light guiding opening enters another detector. Preferably, the light collecting member lies between the light source and the sample cell. Preferably, an optical element used for another detector described above is arranged in the light guiding opening and adjacently to a light path formed by the light collecting member.

Absorbance monitor

A gas analyzing apparatus includes a sample gas line with a sample line valve for providing a sample gas, and a reference gas line with a reference line valve for providing a reference gas. A first gas analyzer is connected to the sample line downstream of the sample line valve, and a second gas analyzer is connected to both the sample and reference gas lines downstream of the valves. The lines are configured such that sample gas and reference gas may be alternately provided to the second gas analyzer either directly or indirectly via the first gas analyzer.

A gas analyzer has a simple composition and can measure multi-components at a high accuracy. A plurality of measuring cells, including a case where the cells are different in length from each other, communicate sequentially with each other through a communication part to form a single gas path. A cut-on filter as an infrared penetration/reflection means for diffracting spectrally an infrared wavelength is provided on a light source side. A NO.sub.X measuring cell 3 having a cell length of about 60 mm and a CO.sub.2 measuring cell 7 having a cell length of about 1 mm which communicate through the communication part with each other, and a capacitor microphone (an infrared-ray detector for NO.sub.X) and a pyroelectric detector (an infrared-ray detector for CO.sub.2) are provided on the infrared penetration and reflection sides of the optical filter.

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Kyoto, Japan

Takuji Oida