Horiba, Ltd.

Takuji Kurozumi

Yoshiaki Togawa

Yasushi Hirata

Tetsuji Yamaguchi

Takahiro Yamada

Tatsuo Igushi

Kimihiko Arimoto

Takahito Inoue

Shintaro Komatani

Makoto Nagura

Hideyuki Ikeda

Sumito Ohzawa

Satoru Goto

Yuki Ishii

Kazuyuki Ikemoto

Heihachiro Taniguchi

Mayuko Kishida

Takashi Kinba

In order to surely discharge dust produced in a sample containing part, the present invention is adapted to include: a dust introduction partthat has a through-holeformed penetrating in a vertical direction and introduces dust produced in the sample containing partinto the through-hole; a dust containing partthat contains the dust discharged through the through-hole; and a dust discharge pathof which one end is connected to the dust introduction partto communicatively connect to the through-holeand the other end is connected to the dust containing part, in which the dust discharge pathis linearly formed along the vertical direction from the one end to the other end.

Analysis apparatus

In order to remove dust attached to a filter memberto surely clean the filter member, an analysis apparatusincludes: a sample containing partthat contains a sample; the filter memberthrough which gas produced from the sample heated in the sample containing partpasses; and a gas flow path Ladapted to lead the gas having passed through the filter memberto an analyzer. In addition, the filter memberis formed in a tubular shape, and in one end part of the filter member, a gas lead-out portconnecting to the gas flow path Lis formed. Further, it is configured that the gas passes through a side wall partof the filter memberfrom outside to inside, and flows from the gas lead-out portto the gas flow path L

Provided is a particle characterization device that can ensure measurement accuracy even though light detecting means has a single configuration, and enables the number of optical elements to be decreased as much as possible to suppress cost increase and reduce the number of adjustment places, and the particle characterization device has an incident side polarizer and an incident side &#xbc; wavelength plate as an illumination optical system mechanism and, as a light receiving optical system mechanism, an exit side &#xbc; wavelength plate and an exit side polarizer that can be rotated to a plurality of angle positions around a cell, wherein light attenuating means that prevents a polarization state from being changed is provided on a light path, and a light attenuation rate by the light attenuating means is controlled such that a detected light intensity at each measurement position falls within a measurement range of light detecting means.

Particle characterization device

In a sample cell that is sealed with an X-ray transmission sheet after a sample such as a liquid fuel or the like is contained therein, when an internal pressure is increased, a cup end surface is deformed so as to increase an internal capacity of the sample cell before the X-ray transmission sheet serving as a window part is expanded. The cup end surface is formed by folding a film-like material and, when the internal pressure of the sample cell is increased, the cup end surface is unfolded outwardly of the sample cell to increase the internal capacity of the sample cell. The increase in pressure is relieved by the increase in capacity, and the expansion of the X-ray transmission sheet is thereby prevented.

Sample cell for fluorescent X-ray analysis and sample cell assembly instrument

This invention may measure the sprayed particle sprayed from the nozzle safely with the use of a conventional particle size distribution measuring device The particle size distribution measuring device may measure particle size distribution of a particle group, and may include a device body comprising a light source that irradiates light on the particle group and a light detector that detects intensity of diffracted light or/and scattered light generated by irradiation of the light, a spray measuring system that introduces a sprayed particle group as being the particle group sprayed from a nozzle into a measuring area between the light source and the light detector, and an ordinary measuring system that arranges a measuring cell that accommodates an ordinary particle group as being a particle group other than the sprayed particle group between the light source and the light detector are arranged to be exchangeable for each other.

Particle size distribution measuring device

In a measurement system, by suppressing the environmental changes of counter-flow of air, and temperature changes and the like, measurement can be accomplished with stable high precision and replication, and by providing a transparent cellwhich stores a particles dispersed in a dispersion medium, and a light source which irradiates light onto the particles within the transparent cell, and multiple light detectorsscattered and arranged to detect the intensity of diffracted/scattered light produced by the irradiation of light, and a computer devicewhich calculates the particle size distribution of the particles based on the light intensity signal output from the light detectors, in addition to the establishment of cell storage space S which stores the transparent celland the equipment storage spaces Sand Swhich store the light source, the light detector, and the optical device, the equipment storage spaces Sand Sare given tight closed construction separate from the cell storage space S.

Particle size distribution analyzer

In order to supply a dispersion medium to a circulation channel not accompanying any mingling of air and to accomplish the reduction of preparation time and the improvement of the measurement accuracy; a dispersion medium supply systemis connected in the vicinity of a drainage outletof a circulation channelcomprising a suspension circulation systemto pressure-pour a dispersionfrom the dispersion medium supply systemto the circulation channel

Particle size distribution measurement device

Light scattering particle size distribution measuring apparatus and method of use

A laser beam optical adjusting mechanism for a particle size distribution measuring apparatus includes a light source to provide a laser beam for irradiating a sample cell and an optical detector unit for receiving an intensity pattern representing the impact of the laser beam on a cell. A mirror assembly is positioned adjacent the light source to reflect the laser beam to irradiate the sample cell. An actuator unit is provided for adjusting the mirror assembly to line an optical axis of the light source with an optical detector. The actuator unit can be automatically driven by a controller and can be of a compact configuration by the use of a pair of lever members that are pivotally supported and respectively driven by actuators.

Growing community of inventors

Kyoto, Japan

Takuji Kurozumi