Yamaichi Electronics Co., Ltd.

W. L. Gore & Associates, Inc.

Kabushiki Kaisha Toshiba

W.l. Gore & Associates, Co., Ltd.

Toyota Jidosha Kabushiki Kaisha

Toshiba Electronic Devices & Storage Corporation

Takeyuki Suzuki

Katsumi Suzuki

Noriyuki Matsuoka

Yoshinori Wakabayashi

Minoru Hisaishi

Alexander Agapov

Koji Asakawa

Ryota Kitagawa

Akira Fujimoto

Yuji Nakamura

Yasuhiko Akaike

Hidefumi Yasuda

Ryo Ujike

Mark D Edmundson

Eiji Kobori

Yasuhiro Akita

Takeshi Nagasawa

Toyohiro Matsuura

Hiroshi Kato

Yuji Kato

Tatsuya Kawahara

Hideki Yamada

Hiroyoshi Fujimoto

Masanori Aimu

Masashi Maruyama

Tomoyuki Takane

Toshitaka Kuroda

Yukio Ota

Yoshikazu Yano

Andrew M Marlett

Satoshi Iizumi

A semiconductor device includes: a first connector including a first plate having a first upper surface and a first terminal connected to the first plate, a first plate including a second plate and a third plate, a plate thickness of the second plate being thinner than a plate thickness of the third plate, the third plate being provided between the second plate and the first terminal; a semiconductor chip provided on the first upper surface; a first bonding material provided between the first upper surface and the semiconductor chip; a second connector provided on the semiconductor chip, a third connector, the first plate being provided between the first terminal and the third connector; a second bonding material provided between the second connector and the semiconductor chip; and a third bonding material provided between the second connector and the third connector.

Semiconductor device

Embodiments are directed to composite membranes having: increased volume of the microporous polymer structure relative to the total volume of the PEM; decreased permeance and thus increased selectivity; and lower ionomer content. An increased amount of polymers of the microporous polymer structure is mixed with a low equivalent weight ionomer (e.g., <460 cc/mole eq) to obtain a composite material having at least two distinct materials. Various embodiments provide a composite membrane comprising a microporous polymer structure that occupies from 13 vol % to 65 vol % of a total volume of the composite membrane, and an ionomer impregnated in the microporous polymer structure. The acid content of the composite membrane is 1.2 meq/cc to 3.5 meq/cc, and/or the thickness of the composite membrane is less than 17 microns. The selectivity of the composite membrane is greater than 0.05 MPa/mV, based on proton conductance and hydrogen permeance.

Highly reinforced ionomer membranes for high selectivity and high strength

A semiconductor device manufacturing jig for electroplating a substrate includes a conductive member. The substrate includes an inner part including a first surface, and an outer rim part surrounding the inner part. The outer rim part has a ring shape that protrudes further than the first surface in a direction perpendicular to the first surface. The conductive member causes a current to flow in the inner part by contacting a portion of the first surface of the inner part without contacting the outer rim part.

Semiconductor device manufacturing jig and method for manufacturing same

Embodiments are directed to composite membranes having a microporous polymer structure, and an ion exchange material forming a continuous ionomer phase within the composite membrane. The continuous ionomer phase refers to absence of any internal interfaces in a layer of ionomer or between any number of layers coatings of the ion exchange material provided on top of one another. The composite membrane exhibits a haze change of 0% or less after being subjected to a blister test procedure. No bubbles or blisters are formed on the composite membrane after the blister test procedure. A haze value of the composite membrane is between 5% and 95%, between 10% and 90% or between 20% and 85%. The composite membrane may have a thickness of more than 17 microns at 0% relative humidity.

Integral composite membrane with a continuous ionomer phase

The cylindrical member includes a cylindrical base materialmade of beryllium copper, a first coating layer that is formed on the base materialand made of a Ni-based material and serves as a reinforcing material for the base material, and a second coating layerthat is formed on the first coating layers and made of a metal-based material different from the base material, wherein the first coating layerhas higher hardness than the base material, when the thickness of the base materialis represented by Tand the layer thickness of the first coating layerformed on the outer surface is represented by T1, the base materialis formed so as to satisfy 13 &#x3bc;m&#x2264;T&#x2264;25 &#x3bc;m, and the first coating layeris formed so as to satisfy T1&#x2265;T&#xd7;4%.

Cylindrical member, contact probe and semiconductor inspection socket

The present invention relates to a roll construction of laminated material that inhibits delamination of the polymer layer from a backer film upon unwinding of the roll construction. Particularly, aspects of the present invention are directed to a roll construction of laminated material prepared by a process that includes providing the laminated material having an ion-exchange resin layer, a release film, and a base layer, and feeding the laminated material to a roller to generate the roll of the laminated material. The laminated material is fed to the roller such that a first layer of the laminated material wound around the core includes the inner surface of the base layer of the first layer contacting an outer surface of the core.

Roll construction of laminated material and method for producing

Embodiments are directed to composite membranes having: increased volume of the microporous polymer structure relative to the total volume of the PEM; decreased permeance and thus increased selectivity; and lower ionomer content. An increased amount of polymers of the microporous polymer structure is mixed with a low equivalent weight ionomer (e.g., &#x3c;460 cc/mole eq) to obtain a composite material having at least two distinct materials. Various embodiments provide a composite membrane comprising a microporous polymer structure that occupies from 13 vol % to 65 vol % of a total volume of the composite membrane, and an ionomer impregnated in the microporous polymer structure. The acid content of the composite membrane is 1.2 meq/cc to 3.5 meq/cc, and/or the thickness of the composite membrane is less than 17 microns. The selectivity of the composite membrane is greater than 0.05 MPa/mV, based on proton conductance and hydrogen permeance.

(Problem) To provide an electrolyte film for fuel cells, capable of achieving both low resistance (film thinning) and high dimensional stability. (Solution) An electrolyte film for fuel cells, the electrolyte film comprising a polymeric electrolyte and a polytetrafluoroethylene (PTFE) porous film, characterized in that a material having an elastic modulus higher than that of the material constituting the PTFE porous film is composited on the inside surfaces of pores of the PTFE porous film, and the composited PTFE porous film has an elastic modulus of at least 150 MPa.

Electrolyte film for fuel cell

The invention provides a contact probe and a semiconductor element socket provided with the same, the contact probe capable of smooth inspection of a device while securing good conductivity. A contact probe has an upper plunger having a contact stem portion, a lower plunger having an insertion hole with which the contact stem portion is capable of coming into contact, and a coil spring connected to the upper plunger and the lower plunger in such a way as to cover the contact stem portion. The coil spring is configured by helically winding a wiring, and includes a guide portion wound tight in the axial direction of the coil spring by the wire, the guide portion located on the lower plunger side of the coil spring and also includes the upper plunger side portion than an upper end portion of the insertion hole.

Contact probe and semiconductor element socket provided with same

An inspection probeAi is formed by subjecting a thin sheet material made of a copper alloy to press working. The inspection probeAi includes: a device side plungerA having a contact point which selectively comes into contact with an electrode portion DVb of a semiconductor device DV; a board side plungerB having a contact point which selectively comes into contact with a contact pad of a printed wiring board; a spring portionD which biases the device side plungerA and the board side plungerB in a direction away from each other; and a cylindrical support stemC being disposed inside the spring portionD, making the spring portionD slidable thereon, and being configured to retain straight advancing property of the spring portionD.

Inspection probe and an IC socket with the same

A light emitting element includes a first semiconductor layer of a first conductive type, a second semiconductor layer of a second conductive type, a light emitting layer. The light emitting layer is between the first semiconductor layer and the second semiconductor layer. A first electrode layer is on a first side of the second semiconductor layer. A second electrode layer is on the first side of the first semiconductor layer. Am insulation layer is between the first electrode layer and the second electrode layer. A first metal layer is between a substrate and the insulation layer and between the substrate and the second electrode layer. The second electrode layer includes a first portion contacting the first semiconductor layer and a second portion which spaced from the first semiconductor layer.

Semiconductor light emitting element

A contact probe having a plunger; a top contacting member which is provided at a tip end of the plunger and is brought into contact with an electrode of a semiconductor device; a bottom contacting member which is brought into contact with an electrode of a testing board; and an elastic member for urging the top contacting member and the bottom contacting member in opposite directions away from each other. The plunger is formed into a cylindrical shape and includes a through-hole which penetrates through the plunger in an axial direction thereof. The top contacting member includes a plurality of mountain-shaped sharp portions at a tip end thereof, and each of the sharp portions is asymmetrical with respect to a straight line that passes through a peak of the sharp portion and extends along an axial direction of the plunger, and is bent toward a center line of the plunger.

Contact probe and semiconductor device socket including contact probe

It is an object of the present invention to provide a fuel cell electrolyte membrane reinforced with a porous substrate which has excellent durability and in which the amount of cross leakage as a result of chemical deterioration of electrolyte membrane components due to the presence of peroxide and/or radicals is particularly reduced. The present invention relates to an electrolyte membrane for a fuel cell comprising a polyelectrolyte, which contains a porous substrate and a radical scavenger dispersed in the polyelectrolyte.

Reinforced electrolyte membrane for fuel cell, membrane-electrode assembly for fuel cell, and polymer electrolyte fuel cell comprising the same

The present invention provides a reinforced electrolyte membrane for fuel cell comprising a porous substrate impregnated with a polyelectrolyte liquid dispersion, wherein either the maximum tensile strength in the machine direction (for sheet processing) (MD) or the maximum tensile strength in the transverse direction (TD; vertical to the MD direction) for the electrolyte membrane is 70 N/mmor more at 23&#xb0; C. at a relative humidity of 50% or 40 N/mmor more at 80&#xb0; C. at a relative humidity of 90%. This reinforced electrolyte membrane for fuel cell, in which the amount of fluorine ions eluted as a result of deterioration of electrolyte membrane components in particular is reduced, has excellent durability.

Reinforced electrolyte membrane for fuel cell, fuel cell membrane-electrode assembly, and solid polymer electrolyte fuel cell comprising the fuel cell membrane-electrode assembly

The probe pin includes a plunger formed of a sheet metal, and a coil spring unit formed of a metal wire and configured to hold the plunger thereon. In a developed state, the plunger includes first and second portions each of which has an upper contact strip, a wide portion, and a lower contact strip, and which are connected to each other via the wide portions formed in the first and second portions. The plunger is formed in a united manner by folding together the first and second portions along a boundary of the wide portions formed therein to thereby bring at least the wide portions into tight contact with each other.

Growing community of inventors

Yokohama, Japan

Takeyuki Suzuki