Fujifilm Corporation

Takeshi Wakita

Takeshi Nakajima

Manabu Higuchi

There is disclosed a defect inspection apparatus, wherein a light source projects a linear light onto a transparent film to inspect, so that a light receiver receives light beams transmitted through the film. The light receiver is placed to look down the film, with its optical axis inclined by a cross angle &#x3b8;to a normal line that is perpendicular to the film surface, and the cross angle &#x3b8;is set in a range from 30&#xb0; to 50&#xb0;. The optical axis of the light receiver is also turned about the normal line by a rotational angle &#x3b8;to a transport direction (S) of the film. The rotational angle &#x3b8;is set in a range from minus 60&#xb0; to plus 60&#xb0;, on the assumption that the transport direction is zero degree.

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Kanagawa, Japan

Takeshi Wakita