Anritsu Corporation

Takeshi Wada

Kazuhiro Fujinuma

Hajime Imazeki

Wataru Aoba

Takashi Miyamoto

Masahiko Dohi

To set an optimum offset voltage and detect an NRZ signal with a very small amplitude. An NRZ signal amplifying deviceincludes: input-side voltage detection meansfor detecting a high-level voltage and a low-level voltage of an input signal to the main amplifier; output-side voltage detection meansfor detecting the two signals inverted relative to each other; and offset voltage control meansfor calculating a center voltage between the detected high-level voltage and low-level voltage, setting an offset voltage at which the center voltage is the center of an appropriate input range of the main amplifierto the offset circuit, and finely adjusting the offset voltage, such that a voltage difference between the detected two signals inverted relative to each other and a polarity change point is close to 0.

NRZ signal amplifying device and method, and error rate measurement device and method

The present invention is to provide a signal analyzing apparatus which can easily identify a pattern high in error rate and a pattern causing bit errors in comparison with the conventional device. In a signal analyzing apparatus () for analyzing a signal from an object under test, and having a display unit () display an analysis result on the signal, the signal analyzing apparatus () includes a statistical processing unit () for statistically processing the analysis result for each of divided sections obtained by dividing an analysis section set for the signal; and a display control unit () for causing the display device to display statistical results obtained by the statistical processing unit for each of the divided sections, when a divided section are identified as a new analysis section, the statistical processing unit performs statistical processing of the analysis result for each of divided sections obtained by dividing the new analysis section, the display control unit causes the display device to display the statistical results obtained by the statistical processing unit for each of new divided sections.

Signal analyzing apparatus

The present invention is to provide a test signal generating apparatus which can generate a test signal for testing a device that dynamically change its operational state in response to a signal or the like. The test signal generating apparatus includes: a pattern storage unithaving patterns; a pattern selecting unitfor selecting a pattern from among the patterns; a test signal generating unitfor generating a test signal having a pattern selected by the pattern selecting unit, a trigger signal receiving unitfor receiving at least one trigger signal, and a pattern map storage unithaving a pattern map defining the number of repetitions for each pattern and a pattern corresponding to a test signal to be generated by the test signal generating unit after the test signal generating unit repeats the test signal on the basis of the number of repetitions.

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Ebina, Japan

Takeshi Wada