Hitachi, Ltd.

Takeshi Uno

Sadahiro Ikeda

Hirotada Ueda

Masakazu Ejiri

Shinji Matsuoka

Toshikazu Yasue

Ikuro Masuda

Shigeru Matsuoka

Seiji Kashioka

Yoshihiro Shima

Jun Motoike

Osamu Isoo

Kunio Suzuki

Koji Kurokawa

An automatic assembly system wherein parts supplied from a feeder are held by a holder and are automatically mounted onto predetermined positions of a circuit board; comprising a first image pickup device which images at least a portion of said circuit board, a second image pickup device which images at least a portion of the part held by the holder means, a signal processor which processes an output of said first image pickup device to detect a deviation of said circuit board from a reference position and which also processes an output of said second image pickup device to detect a magnitude of deviation between said part and the predetermined position of said circuit board, and a positioning device which operates under control of said signal processor so as to adjust said predetermined position of said circuit board to a position opposing to said part and also to move said part toward said circuit board.

Automatic assembly system

A coded label comprising a code pattern in which first and second segments respectively being substantially square and having reflection factors different from each other are arranged in at least four rows and two columns, and in which at least two of either of the first and second segments are arranged in each column and at least one is arranged in each of the uppermost and lowermost rows.

Coded label and code reader for the coded label

In a mark detecting system using an image pickup device such as a TV camera in which a mark in the form of a regressive reflector is provided on an object, the field of view of the image pickup device is illuminated with light of a specified wavelength from an illuminating device placed in the vicinity of the image pickup device. The reflected light is introduced on the image pickup device through a filter capable of cutting off light having wavelengths other than the specified wavelength. Since the mark forms a bright pattern on an image produced within the field of view of the image pickup device, the position of the mark can be easily detected by means of a data processor which processes image signals.

Mark detecting system using image pickup device

A recognition device for recognizing the shape and the position of an object includes means for applying a bundle of parallel light beams having a specific cross-section to a space containing the object, means for transducing the light informations from the space into image signals, means for extracting from said image signals a specific pattern corresponding to the portion to which the bundle of light beams is applied and means for determining the position of the pattern on the image surface, whereby the existence, shape and the position of the object are recognized from the information on the image surface.

Recognition device for recognizing the shape and the position of an

This method for recognizing a specific pattern is characterized in a process of extracting feature parts wherein one or more certain feature parts of specific shape are extracted from an input pattern; the next feature part is then extracted from an extracting area which is determined from the position on the input pattern where a previous feature part was extracted; and in case that the next feature part fails to be extracted from the extracting area so determined, the initial condition is restored thereby extracting the feature part by successively limiting extracting areas.

Method and device for recognizing a specific pattern

A pattern recognition system comprises a partial pattern cutting out system which has a plurality of cutting out windows previously provided in correspondence with a plurality of regions in a specific pattern which respectively correspond to a characteristic part of the specific pattern to be recognized and which constitute patterns symmetric to each other. A binary input signal is cut out by the use of the partial pattern cutting out apparatus. The 'EXCLUSIVE OR' function between the corresponding bits of the partial patterns obtained from the plurality of cutting out windows are evaluated by 'EXCLUSIVE OR' circuits. The number of outputs of predetermined logic level among the outputs of the 'EXCLUSIVE OR' circuits and a preset number are compared, and the coincidence between both the numbers is sought. When both numbers coincide, the inputted signal is recognized as being the specific pattern.

Pattern recognition system

A pattern recognition system comprises a picture tube for picking up an object to be recognized, a partial image pattern cutting out apparatus which, in turn, outputs a plurality of partial image patterns cut out from an image pattern obtained from the picture tube, the partial image patterns being output in synchronization with the scanning of the picture tube and a memory storing a plurality of partial standard patterns. Each of the partial image patterns is compared with the respective partial standard patterns and the respective partial image patterns similar to each partial standard pattern are grouped every partial standard pattern. A group of the partial image patterns, each of which is closely spaced from each other in a position of two-dimensional coordinate is selected from each group of the grouped partial image patterns and the respective representative positions of the respective elected groups of the partial image patterns are calculated. The shape and the position of the object to be recognized can be detected from the fact that the respective representative positions are closely spaced from each other in a position of a two-dimensional coordinate.

Pattern recognition system utilizing a plurality of partial standard

An automatic working machine adapted to carry out works such as cutting, filling, tightening and loosening, which comprises a visual unit for detecting, by means of the image information, a plurality of works and obstacles existing on an object, a working unit which works against a particular work and moves in relation to the object, and a tactile sensor provided in the vicinity of the working unit, the working unit being precisely positioned by the aid of the tactile sensor when the visual unit detects the particular work, the relative position being maintained during the operation, and the working unit along with the tactile sensor being retracted when the visual unit detects an obstacle, to avoid collision thereof with the obstacle.

Automatic working machine

A pattern recognition apparatus for discriminating a body having a specified shape from a number of bodies, in which an image area, at which the image signal has a value within a specified range, within a specified region of the image of a body is measured and whether or not the image area is within the range predetermined by the body to be recognized is decided.

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Sayama, Japan

Takeshi Uno