Tatsuno Corporation

Kabushiki Kaisha Toshiba

Tokyo Shibaura Denki Kabushiki Kaisha

Adv Antest Corporation

Other

Tokyo Shibaura Electric Co., Ltd.

Her Majesty the Queen in Right of Canada, As Represented by the Minister

Takeshi Ozeki

Taku Kamikochi

Toshifumi Tamura

Hiroyuki Ibe

Norikazu Osawa

Kiyoshi Kimura

Makoto Arai

Masahiro Takezawa

Taro Shibagaki

Yasuhiko Eda

Jun Tanaka

Nobuo Suzuki

Makoto Ohashi

Toshikazu Kodama

Masaru Nakamura

Motoki Imamura

Mutsumi Fujihara

Tomoyu Yamashita

Takashi Kido

Elmer H Hara

Kenichi Donuma

Kazushi Takahashi

Hiroshi Mori

Manish Sharma

Takehiko Atsumi

Kanan Matsuda

Hideaki Yamakawa

Shinichi Tsubura

Tsuyoshi Koike

Masanori Matsumura

Shigeru Ohshima

Kouichi Nitsuta

Yoichi Hirayama

Gas filling apparatus

Filling nozzle

Nozzle hook

Flowmeter

An LNG filling apparatus that can safely fill LNG in LNG vehicles. A filling apparatusfor filling LNG in an in-vehicle tank, the apparatushaving a housing, a recovery hoseand a filling hoseseparately led from the housing, a recovery mechanismfor recovering a natural gas from the in-vehicle tank via the recovery hose, and a filling mechanismfor filling LNG to the in-vehicle tank via the filling hose. Separately leading the recovery hose and the filling hose from the housing with these hoses in close proximity to each other allows a range capable of filling that is the overlap range between a connectable range of the recovery hose and a connectable range of the filling hose to be enlarged. A single hose led from the housing can be used for both of the recovery of the natural gas and the filling of the LNG, which prevents tangle of hoses with each other, and enables to fill the LNG in the in-vehicle tank safely.

Liquefied natural gas filling device

Main body of gas filling apparatus

To enable measuring optical characteristics of a device under test by overcoming a limit of detection sensitivity caused by detecting light as 'wave'. Of an entangled photon pair generated by entangled photon pair generating means, signal light transmits through a device under test (DUT), and idler light transmits through a variable delay line. The signal light after transmitting through the device under test (DUT), and the idler light after transmitting through the variable delay lineare supplied for a semi-transparent mirrorto generate quantum interference. Then, if the timing when photon of the first multiplexed light is detected by a first photon detector, and the timing when photon of the second multiplexed light is detected by a second photon detectormatch, a multipliersupplies a pulse, and a countercounts the pulse. Based on the count, characteristic measuring meansobtains match detection probability, thereby measuring optical parameters of the device under test. Since the measurement uses the quantum interference, it is possible to measure the optical characteristics of the device under test at a high accuracy, and in a wide dynamic range.

Apparatus, method, and program for measuring optical characteristic using quantum interference, and recording medium for recording the program

A device for measuring &#x3c4;includes a polarization controller () that allows first (second) incident light, in a synthetic incident light to an object to be measured (), to be in line with a p-polarization (s-polarization) axis in a polarization separator (). The phase shift equivalent value (optical angle frequency differentiation) and amplitude equivalent value (square value) of a first (second) incident light component in an output from the polarization separator () measured by a first (second) measuring unit () are respectively the phase shift equivalent value and amplitude equivalent value of a first column T, T(second column T, T) when the transfer function matrix of the object () is a 2&#xd7;2 matrix to thereby allow a control unit () to determine the polarization mode dispersion &#x3c4;of the object ().

Polarization mode dispersion measuring device, method, recording medium

A polarization mode dispersion measuring apparatus includes a variable wavelength light source for providing light of a variety of wavelengths; a light intensity modulator optically connected to the light source to provide light of modulated intensity; a polarization controller optically connected to the light intensity modulator to provide light of controlled polarization; a beam splitter optically connected to the polarization controller to provide beams of p and s polarization components; an O/E conversion unit optically connected to the beam splitter to provide electrical signals with respect to the beams of the p and s polarization components; and an analyzing unit for controlling the light intensity modulator to provide a sine wave of a predetermined frequency and a predetermined intensity, and the light source and the polarization controller to determine parameters of Jones matrix from the electrical signals and a polarization mode dispersion defined by the parameters, thereby measuring a polarization mode dispersion of an object placed between the polarization controller and the beam splitter.

Polarization mode dispersion measuring instrument and method

An optical network analyzer measures the amplitude characteristics and group delay time dispersion characteristics of an optical circuit device. In the optical network analyzer, the intensity of the light generated by a first light source is modulated by use of a modulation signal having a constant frequency and a constant amplitude. Part of the intensity-modulated light is used as a reference optical signal, and the remaining part is made to pass through the optical circuit device, thus obtaining an optical signal to be measured. The reference optical signal and the optical signal to be measured are photoelectrically converted into electric signals, and the modulated signal components of the electric signals are compared with each other, thus obtaining an amplitude ratio and a phase difference. The optical frequency of the first light source is swept in a constant cycle, and the amplitude ratio and phase difference are displayed on a display device in synchronism with the frequency sweeping. To implement an optical frequency marker, light having an arbitrarily-designated optical frequency is generated by a second light source. The light generated by the second light source is made to join part of the light generated by the first light source, so as to produce a peak at the designated optical frequency. The peak is electrically extracted and superimposed on the amplitude ratio and phase difference displayed on the display device.

Optical network analyzer for measuring the amplitude characteristics and

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Tokyo, Japan

Takeshi Ozeki