Panasonic Corporation

Matsushita Electric Industrial Co., Ltd.

Takeru Yamashita

Shigeo Kigo

Toshiyuki Maeda

Hidehiko Shoji

Akihiko Watanabe

Jumpei Hashiguchi

Minoru Takeda

Nobuo Taketani

Yoshihiro Kishimoto

Tomohiko Kanemitsu

Naoyuki Tomioka

Kazuki Sawa

Yoshiki Tsujita

Noriyuki Iwakura

Wataru Itoh

Hiroko Yamamoto

Tooru Kawase

Takashi Ootomo

Hiroshi Yoshinari

Shozo Tozaki

Hiroyuki Kakinuma

Masayuki Tagami

Teruaki Takeuchi

Kei Kitatani

A plasma display device includes the following elements: an image signal conversion circuit for converting an image signal into an image data; a data electrode driver circuit for driving data electrodes according to the image data; a power calculation circuit for calculating a power consumption of the data electrode driver circuit according to the image data; and a temperature calculation circuit for calculating a temperature of the data electrode driver circuit according to the image data. The image signal conversion circuit converts the image signal into an image data decreasing the power consumption of the data electrode driver circuit at least when the calculated power consumption exceeds a predetermined power threshold value, or when the calculated temperature exceeds a predetermined temperature threshold value.

Plasma display device

A scene change detecting circuit () detects a scene change of video. An average luminance level operating circuit () calculates an average luminance level (APL) of a video signal (VD). A luminance overdrive amount calculating circuit () calculates a luminance overdrive amount (OD) based on the average luminance level (APL). A time-linked attenuating circuit () outputs a power consumption limit correction amount (PA) by attenuating the luminance overdrive amount (OD) with an elapse of time from a point in time of detecting the scene change. An adder () adds the power consumption limit correction amount (PA) and a reference power consumption limit value (Lp) to output the addition result as a power consumption limit amount (PL). An ABL circuit () calculates a luminance limit amount (BL) based on luminance limit characteristics, the average luminance level (APL) and the power consumption limit amount (PL). A luminance level control circuit () determines a display drive condition (BC) based on the luminance limit amount (BL). A PDP drive controller () drives a display panel () based on the video signal (VD) and the display driving condition (BC).

Luminance level control device

Data driver modules are connected to a driver controller. In driver-data output clock selection sections and driver data control sections, each equal in number to the data driver modules that are connected to the driver controller, the phase of driver data is adjusted for each data driver module, while the phase of each driver clock is adjusted in driver-clock output clock selection sections and driver clock control sections.

Driver controller for controlling a plurality of data driver modules included in a display panel

A panel driving method has, in one filed time period, an all-cell initializing subfield for causing initializing discharge in all discharge cells for displaying an image in the initializing period, and a selection initializing subfield for selectively causing initializing discharge in the discharge cell that has caused sustaining discharge in the last subfield in the initializing period. The number of all-cell initializing subfields can be increased and decreased, and the initializing voltage for causing initializing discharge in the all-cell initializing subfield can be varied. At least one of the number of all-cell initializing subfields and the initializing voltage of the all-cell initializing subfields in one field is controlled based on the accumulation of the panel power-on time.

Method of driving plasma display panel, and plasma display device

A plasma display panel driving method and a plasma display device estimate the highest temperature and the lowest temperature the panel can have, according to the temperature detected by the thermal sensor, and appropriately drives the panel, to improve the image display quality. Provided are at least three driving modes having different sub-field structures: a low-temperature driving mode, an ordinary-temperature driving mode, and a high-temperature driving mode. To drive the panel, estimates of the highest temperature and the lowest temperature the panel can have are made from the temperature detected by the thermal sensor, the temperature condition of the panel is determined from the estimated highest temperature or lowest temperature, and the driving mode is switched appropriately for the panel temperature condition.

Plasma display panel driving method having a high temperature and low temperature driving mode and plasma display device thereof

In a method of driving a panel, in initializing periods of a plurality of sub-fields constituting one field, one of all-cell initializing operation or selective initializing operation is performed. In the all-cell initializing operation, initializing discharge is performed in all the discharge cells for displaying an image. In the selective initializing operation, initializing discharge is selectively performed only in the discharge cells subjected to sustaining discharge in the sub-field immediately before the sub-filed. According to the average picture level (APL) of the signal of an image to be displayed or the light-emitting rate of a predetermined sub-field, the initializing operation in the initializing period of each sub-field is determined to be one of the all-cell initializing operation and the selective initializing operation.

Method of driving plasma display panel

An assembly for an LSI test supplies a test signal output from an LSI tester to a target LSI to be tested and outputs, to the LSI tester, a test result signal generated by processing of the target LSI performed in accordance with the test signal. The assembly for an LSI test includes: a peripheral circuit coupled to the target LSI and allowing the target LSI to operate in the same manner as in the application environment; and a printed circuit board on which the peripheral circuit is mounted.

Assembly for LSI test and method for the test

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Osaka, Japan

Takeru Yamashita