Sysmex Corporation

Takeo Okuyama

Shoichiro Asada

Kazuki Asao

Tsukasa Hirata

Disclosed is a method for adjusting a position of an aspirator in a sample processing apparatus, the sample processing apparatus comprising the aspirator configured to aspirate a sample or a reagent from a container and a capacitance sensor connected to the aspirator to detect change in capacitance, the method comprising: moving the aspirator above a position adjustment part which is electrically conductive and which is disposed at a predetermined position; obtaining capacitance detected by the capacitance sensor while moving the aspirator; and setting reference position information indicating a reference position of the aspirator based on change in the obtained capacitance.

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Kobe, Japan

Takeo Okuyama