Nec Corporation

Takeo Nozaki

Kenichiro Fukushi

Hisashi Ishida

Manabu Kusumoto

Yoshio Kameda

Satoshi Nishii

Satoshi Morinaga

Chenpin Hsu

A walking state measurement device according to the present invention includes: at least one memory storing a set of instructions; and at least one processor configured to execute the set of instructions to: estimate a floor reaction force by use of at least either of motion data and lower limb vertical load data of a walker, and outputting the floor reaction force as floor reaction force data; and calculate a walking state of the walker by use of at least either of the motion data and the floor reaction force data, and outputting the walking state.

Walking state measurement device, walking state measurement system, walking state measurement method, and storage medium for storing walking state measurement program

Provided is to determine a walking state when a target person uses a stick. A walking state determination device according to an embodiment of the present invention includes: an acquisition unit that acquires feature information indicating a feature of a motion of a target person when using a stick, based on first measurement data acquired from a first sensor installed at the stick and second measurement data acquired from a second sensor installed at the target person; and a determination unit that determines a walking state of the target person, based on the acquired feature information.

Walking state determination device, walking state determination system, walking state determination method, and storage medium

Provided are a reference scale and dimension measurement system that make it possible to maintain accurate measurement even if the reference scale is not disposed or projected on a measurement surface. A dimension measurement device according to the present invention is provided with: a reference scale extraction means for extracting, from photographed image data including a reference scale that includes a film that has a pattern for displaying a length reference formed on the surface thereof and a lens that is in contact with the film, an image in which an image of the length reference is formed on the basis of the relationship between a pattern function expressing the length reference projected onto the lens according to variation in a prescribed angle between the reference scale and the optical axis of a photography device and an image formation color function indicating the image of the length reference formed on the imaging device; an object of measurement extraction means for extracting an object of measurement image from photographed image data including the reference scale; and a dimension calculation means for calculating a dimension of the object of measurement on the basis of a dimension of the image in which the image of the length reference is formed and the image of the object of measurement.

Dimension measurement device, dimension measurement system, and dimension measurement method

An information processing device according to the present invention, includes: an information accumulation unit which receives and accumulates control-target information that includes information related to a control target and an environment including the control target; a prediction-equation-set learning and generation unit which learns and generates a prediction-equation set to be used for determination of an operation quantity of the control target based on the control-target information accumulated in the information accumulation unit; and an operation-quantity determination unit which receives input information needed for determination of an operation quantity of the control target, constructs a predictive-control model of the control target based on the prediction-equation set, the control-target information accumulated in the information accumulation unit, the control-target information received, and the input information, and determines an operation quantity used for control of the control target.

Information processing device, predictive control method, and recording medium

An image generation apparatus is provided with: a resolution sensitivity conversion unit which generates different weight-averaged images by performing convolution operations on the infrared image with plural different weighted-filter images, and generates a resolution-sensitivity-converted image by adding luminance differences between the weight-averaged images to luminance values of the infrared image; a luminance shift calculating unit which sets the most frequently appearing luminance value of the resolution-sensitivity-converted image to an intermediate value in an enlarged range and as an intermediate luminance value, and generates a luminance-shifted image obtained by linearly shifting luminance values of the resolution-sensitivity-converted image in such a manner that the shifting corresponds to the intermediate luminance value and the enlarged range; and a luminance arithmetic operation unit which generates an arithmetically processed image by performing an arithmetic operation based on luminance differences between corresponding positions of the luminance-shifted image and a reverse shifted image.

Image generation apparatus, image generation method and image generation program

A device is provided with a luminance histogram calculation unit which generates a luminance histogram showing appearance frequency of luminance values contained within the infrared image and determines a luminance value corresponding to a peak in the luminance histogram as a background luminance level of the background; a luminance shift calculation unit which sets the background luminance value as an intermediate value in luminance range width of the infrared image and generates a luminance shift image by linearly shifting other luminance values in the infrared image based on the intermediate value; a reversed image processing unit which generates a reversed shift image wherein the luminance level of the luminance shift image is reversed; and a luminance calculation processing unit which generates a calculation-processed image by performing calculation processing based on the difference in the luminance values at corresponding positions in the luminance shift image and the reversed shift image.

Image target identification device, image target identification method, and image target identification program

In this pattern inspection device, the optical scanning section scans the inspected pattern using a laser beam. A photoelectric image processing section generates an image of the inspected pattern. A reference image generation section calculates the gray level of each pixel according to the number of sub-pixels belonging to the pattern developed in each pixel and calculates the pattern width for the inspected pattern and the reference data with treating the count obtained by dividing the gray level by the gray level step count as the width of the pattern developed in that pixel.

Pattern inspection method and pattern inspection device

A method and an apparatus are presented for correcting corner images of an integrated circuit pattern, for example, in an real image produced by optical scanning and deleting defects from the corner sections. Design data describing rectangular or trapezoidal patterns are expanded in a design data expansion section in multi-level gradations to produce a reference data for each pixel having resolution capability less than the inspection resolution capability. In a reference image forming section, based on the edge position of the real image, the reference data are processed to produce a reference image by rounding off the corner section and the line width while maintaining multi-level gradations. The boundary regions are blended using optical point spread functions obtained from the real image.

Method and apparatus for multi-level rounding and pattern inspection

A reference image forming method is used in a pattern inspection apparatus for scanning a pattern formed on an object to be inspected on the basis of design data with a laser beam having a predetermined wavelength, focusing transmitted light passing through the object on a light-receiving element by using an objective lens, forming a real image from pattern information obtained from the light-receiving element, and comparing the real image with a reference image obtained by imaging the design data, thereby detecting a defect in the object. In this method, reference data is formed by developing the design data as a pattern made of multilevel gradation values on pixels having a resolution higher than an inspection resolution. A reference image is formed by increasing or decreasing the width of each pattern of the reference data as a multilevel gradation pattern with a precision higher than the inspection resolution on the basis of an edge position of a corresponding pattern in the real image. A pattern inspection apparatus is also disclosed.

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Tokyo, Japan

Takeo Nozaki