Hon Hai Precision Industry Co., Ltd.

Hong-fu Jin Precision Industry (shenzhen) Co., Ltd.

Fine Tech Corporation

Takeo Nakagawa

Qing Wen Liu

Jun-Qi Li

Koichi Nakagawa

Isao Shiozawa

A friction stir welding method utilizes a joining tool comprising a friction surface; a first workpiece comprising a first treating layer, a second workpiece comprising a second treating layer, and a joining member with a melting point lower than that of the first workpiece and the second workpiece. The joining member is arranged at the joining portion of the first workpiece and the second workpiece, and abutting the first workpiece and the second workpiece. The friction surface of the joining tool is positioned to resist at least one of the first treating layer and the second treating layer. The joining tool is rotated and moved to agitate at least one of the first workpiece and the second workpiece, until at least part of the first workpiece and the second workpiece are plasticized and joined together.

Friction stir welding method and friction stir welded housing

A friction stir welding method includes providing a joining tool including a friction surface, a first workpiece, and a second workpiece, and arranging the first workpiece and second workpiece in position with a first joining surface abutting a second joining surface. A friction surface of a joining tool resists at least one of the first treating surface and the second treating surface, and the first workpiece and the second workpiece cooperatively define a slot. Then positioning, rotating, and moving the joining tool to rub and stir at least one of the first workpiece and the second workpiece, thus plasticizing at least part of the first workpiece and the second workpiece to join the first workpiece and the second workpiece.

Friction stir welding method

A friction stir welding method includes providing a joining tool including a friction surface; providing a first workpiece and a second workpiece; arranging the first workpiece and second workpiece in position with a first joining surface abutting a second joining surface, a friction surface of a joining tool resisting at least one of the first treating surface and the second treating surface; positioning, rotating and moving the joining tool to rub and stir at least one of the first workpiece and the second workpiece, thus plasticizing at least part of the first workpiece and the second workpiece to join the first workpiece and the second workpiece.

A friction stir method includes providing a joining tool, a mold comprising a top surface and a cutout defined from the top surface, and a workpiece comprising a treatable layer and arranged on the top surface of the mold. The joining tool resists the workpiece, and rotates and moves to agitate the treatable layer of the workpiece along an extending direction of the cutout of the mold, until a protrusion integrated with the workpiece is formed in the cutout of the mold.

Friction stir method

An exemplary contour measuring probe includes a guide (), a movable rack, a counter-balancing mechanism, a linear measuring scale (), and a displacement sensor (). The movable rack comprises a tip extension () for touching a surface of an object. The tip extension () is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale () displays values of displacements of the tip extension (). The displacement sensor () detects and reads the displacement values displayed by the linear measuring scale ().

Contour measuring probe

An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.

Contour measuring method for measuring aspects of objects

An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe () comprising a tip extension (), a displacement sensor (), and a processor () connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.

An exemplary contour measuring device () includes a pair of guide rails (), a movable fixture (), a first probe (), a second probe (), and an error correcting unit (). The movable fixture is movably disposed on the guide rails. The first probe is configured for measuring an object along a contour measuring direction and obtaining a first measured contour value from the object to be measured. The second probe is configured for measuring a standard object whose contour is known along the contour measuring direction and obtaining a second measured contour value from the standard object. The error correcting unit is configured for compensating the first measured contour value according to the second measured contour value.

Contour measuring device with error correcting unit

An exemplary distance measuring probe () includes a tube track (), a tip extension (), a pair of hollow tubes (), a pair of air discharge systems (), a linear measuring scale (), and a displacement sensor (). The tip extension is configured to touch a surface of an object (). The linear measuring scale and the displacement sensor are respectively fixed relative to one of the tube track and the tip extension. The hollow tubes contain a flux of air, and are configured to cooperatively push the tip extension to move. Each air discharge system ejects part of air in the corresponding hollow tube out of the hollow tube. The linear measuring scale displays values of displacements of the tip extension. The displacement sensor detects and reads the displacement values displayed by the linear measuring scale.

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Tokyo, Japan

Takeo Nakagawa