Hitachi, Ltd.

Hitachi Information & Control Solutions, Ltd.

Takenori Kasahara

Masakazu Ishikawa

Tatsuyuki Ootani

Yasuyuki Furuta

Manabu Kubota

Eiji Kobayashi

Wataru Sasaki

Masahiro Shiraishi

Yusaku Otsuka

Yasuhiro Kiyofuji

Shin Kokura

Satoru Funaki

Katsumi Yoshida

Naoya Mashiko

Akihiro Onozuka

Masamitsu Kobayashi

Takashi Umehara

Yu Iwasaki

Hisashi Terae

Yuusuke Seki

Akira Bandou

Atsushi Nishioka

Shoichi Ozawa

Akihiro Nakano

Syuichi Nagayama

Fujiya Kawawa

Hidechiyo Tanaka

In a control apparatus which transmits/receives data from a central processing unit via a serial transfer channel to a communication control unit, and groups/distributes data of input/output units from the communication control unit via a parallel transfer channel, the control apparatus initiates a diagnosing unit of the parallel transfer channel in response to an instruction issued from the central processing unit, and diagnosis the input/output units subsequent to the diagnosis of the transmission channel. Data input/output timing of the input/output unit is also instructed from the central processing unit, so that the central processing unit can suppress lowering of response speeds caused by the diagnoses, and can maintain the periodicity of the data input/output.

Control apparatus, control method and control program

A fault diagnosis apparatus and method capable of simultaneously detecting the fault of a multiplexer and the fault of an A/D converter and isolating and identifying causes of these faults, the multiplexer and the A/D converter being used in a multi-channel analog input/output circuit. Test-voltage values are inputted from a diagnosis-voltage input unit into the multiplexer and the A/D converter constituting an analog-signal conversion unit, the multiplexer having plural channels, the A/D converter converting outputs from the multiplexer into digital signals, the test-voltage values being different from each other for each channel of the multiplexer. Comparisons are made between the digital voltage values and the test-voltage values inputted, the digital voltage values being outputted for each channel of the multiplexer. From this comparison result, it is judged whether the multiplexer is at fault or the A/D converter is at fault.

Fault diagnosis apparatus and fault diagnosis method of multi-channel analog input/output circuit

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Naka, Japan

Takenori Kasahara