Panasonic Corporation

Panasonic Intellectual Property Management Co., Ltd.

Takehiro Asahi

Naoya Ryoki

Kentaro Miyano

Masaki Nobuoka

Yoshio Okayama

Yukio Nishikawa

Akio Ueta

Naoto Yanagita

A light emitting device includes a light source and a waveguide structure. The light source emits light having a directionality. The waveguide structure includes an optical waveguide and an exterior part. The optical waveguide has an incident end surface and an emission end surface, converts a wavelength of the light incident from the incident end surface, and emits the light from the emission end surface. The exterior part is optically transparent and covers the optical waveguide such that the incident end surface and the emission end surface are exposed from the exterior part. The optical waveguide is elongated in a length direction. The length direction of the optical waveguide is inclined at a predetermined angle with respect to an optical axis of the light in a predetermined plane including the length direction of the optical waveguide and the optical axis of the light. The predetermined angle is set to allow the light to propagate in the optical waveguide with total internal reflection at a boundary surface between the optical waveguide and the exterior part.

Light emitting device, manufacturing method therefor, and waveguide structure

An object is to provide a high-quality ScAlMgOsingle crystal and a device. The ScAlMgOsingle crystal includes Sc, Al, Mg, and O, in which the atomic percentage ratio of Mg to Al, Mg/Al (atom %/atom %), as measured by an inductively coupled plasma emission spectrometric method, is more than 1 and less than 1.1.

ScAlMgO4 single crystal and device

A ScAlMgOsingle crystal substrate having less collapse of crystal orientation, and a method for producing the single crystal substrate. A ScAlMgOsingle crystal substrate is provided, wherein, when a center of the substrate is designated as coordinates (0,0) and a measurement beam width is set to 1 [mm]&#xd7;7 [mm] to conduct analysis according to an X-ray diffraction method at respective coordinate positions of (x,0) to (x,0) at an interval of 1 [mm] in an x-axis direction and (0,y) to (0,y) at an interval of 1 mm in a y-axis direction, wherein m and n are each an integer falling within the range so that the measurement beam is not stuck out from the substrate, a worst value of a full width at half maximum of a rocking curve at each of the coordinate positions is less than 20 [sec.].

ScAIMgOsingle crystal substrate and method for producing the same

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Hyogo, Japan

Takehiro Asahi