Sharp Kabushiki Kaisha Corporation

Takehiko Kawamura

Masahiro Yoshida

Isao Ogasawara

Junichi Morinaga

Hideaki Takizawa

Katsuhiro Okada

Junichi Yamada

Kazunori Tanimoto

Hidenobu Kimoto

Seijirou Gyouten

Satoshi Horiuchi

Makoto Yokoyama

Sachio Tsujino

Tetsuya Tarui

In a display device, the metal layer includes a plurality of openings, and electrode pads having an island shape overlap one or more of the plurality of openings via an insulating film including at least a flattening film.

Display device and method for inspecting display device

A display device including: a driver outside a display area; a special-shape portion on an edge of the display area, the special-shape portion being shaped like a line that is curved or oblique to an extension direction of signal lines in the display area; a plurality of first-type circuit blocks outside the special-shape portion, each of the first-type circuit blocks including a unit circuit for the driver in a rectangular region having a first side parallel to the extension direction and a second side perpendicular to, and shorter than, the first side; and a plurality of second-type circuit blocks outside the special-shape portion, each of the second-type circuit blocks including a unit circuit for the driver in a rectangular region obtained by rotating the previous rectangular region by 90&#xb0;.

Display device

A liquid crystal display panel () according to the present invention includes a plurality of spacers configured to hold a gap between a first substrate () and a second substrate (). The plurality of spacers include a plurality of first spacers in a display region and a plurality of second spacers () in a non-display region. The first substrate includes a first metal layer () and a second metal layer (), a first transparent conductive layer () formed on the second metal layer and in direct contact with the second metal layer, a second inorganic insulating layer () formed on the first transparent conductive layer, and an organic insulating layer () formed on the second inorganic insulating layer. When viewed from the normal direction of the first substrate, each of the plurality of spacers overlaps with the first transparent conductive layer and the second inorganic insulating layer, and overlaps with the first metal layer and/or the second metal layer. Each of the plurality of spacers includes a part of the organic insulating layer.

Liquid crystal display panel and method for manufacturing same

Provided is a technique of suppressing display defects such as flicker, without limiting the arrangement of data lines, in a liquid crystal display device having a display area in a non-rectangular shape. A liquid crystal display device includes an active matrix substrate 10, a counter substrate, and a liquid crystal layer. The active matrix substrate 10 includes a plurality of gate lines 11, and a plurality of data lines 12. In each of pixels defined by the gate lines 11 and the data lines 12, a pixel electrode 14 is arranged, and in a display area R, common electrodes 15 are provided. Outside the display area R, capacitance-generating parts C that generate capacitances between some gate lines 11 among the plurality of gate lines 11 and the common electrode are provided. The some gate lines 11 have lengths smaller than the gate lines having the maximum length, and intersect with some data lines 12 among the plurality of data lines 12. The capacitance-generating parts C are provided in such a manner that at least one capacitance-generating part C is provided with respect to one of the some gate lines 11.

Liquid crystal display device

An active matrix substrate for a liquid crystal panel of an FFS mode includes a plurality of connecting units in a connecting region in order to electrically connect a common electrode, a first common main wiring, and a second common main wiring. The connecting unit includes a contact holethat connects a connecting electrodeand the first common main wiring, the connecting electrodeformed integrally with the common electrode, and a contact holethat connects the connecting electrodeand the second common main wiring. An amorphous Si filmof the second common main wiringis formed larger than a main conductor partof the second common main wiringin a position of the contact hole, and is covered with SiNx filmsthat are protective insulating films. This prevents the connecting electrode from having a step disconnection at a pattern end of the common main wiring.

Active matrix substrate, liquid crystal panel, and method for manufacturing active matrix substrate

An active matrix substrate () is provided with first connecting wirings () connected to gate terminals () to which extraction wirings () are connected, second connecting wirings () connected to gate terminals () to which extraction wirings () are connected, bundled wirings (to) each composed of a mutually adjacent first connecting wiring and second connecting wiring bundled together, a first inspection wiring () capable of inputting an inspection signal to bundled wirings () that are not adjacent to each other among the bundled wirings, and a second inspection wiring () capable of inputting an inspection signal to bundled wirings () that are not adjacent to each other and not connected to the first inspection wiring () among the bundled wirings.

Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device

Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines () include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate () includes a first inspection line () and a second inspection line () that cross each of a plurality of first connection lines (), and a third inspection line () and a fourth inspection line () that cross each of a plurality of second connection lines (). The first to the fourth inspection lines () are formed in a frame-shaped wiring region (), excluding the terminal arrangement region () and the display region ().

Active matrix substrate, display device, method for inspecting active matrix substrate, and method for inspecting display device

An active matrix substrate is provided with first inspection wirings () capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings () and to second switching wirings that are not adjacent to each other among the second switching wirings (), and second inspection wirings () capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings () and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings ().

Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device

An active matrix substrate () is provided with first connecting wirings () connected to gate terminals () to which extraction wirings () are connected, second connecting wirings () connected to gate terminals () to which extraction wirings () are connected, bundled wirings (to) each composed of a mutually adjacent first connecting wiring and second connecting wiring bunched together, a first inspection wiring () capable of inputting an inspection signal to bunched wirings () that are not adjacent to each other among the bundled wirings, and a second inspection wiring () capable of inputting an inspection signal to bundled wirings () that are not adjacent to each other and not connected to the first inspection wiring () among the bundled wirings.

Growing community of inventors

Sakai, Japan

Takehiko Kawamura