Fujifilm Corporation

Fuji Photo Film Company, Limited

Takeharu Tani

Masayuki Naya

Toshihiko Baba

Hiroo Takizawa

Shinya Hakuta

Nobufumi Mori

Naoharu Kiyoto

Masaharu Akiba

Ryou Matsuno

Yoshio Inagaki

Yujiro Yanai

Shunya Katoh

Keisuke Kodama

Masashi Ono

Hiroaki Hyuga

Hideyasu Ishibashi

Katsuhisa Ohzeki

Hideki Yasuda

Masahiro Takata

Atsushi Mukai

Tatsuya Yoshihiro

Yoshitaka Yamaguchi

Hideki Asano

Naoko Yoshida

Koh Kamada

Yuki Matsunami

Hidemasa Hosoda

Eriko Ikeda

Naoki Morinaga

Provided is a curable composition including oxide particles that include at least indium and tin, and to which a ligand having a hydrocarbon group and a binding site to the oxide particles is bonded; and a polymerizable compound, in which a content of the oxide particles in the composition is 18 mass % or more with respect to a total solid content of the composition; and a cured product of the curable composition or a lens unit including the cured product.

Curable composition, cured product, and lens unit

Provided are a bandpass filter having a high light transmittance in a transmission band and a wide wavelength range showing a high transmittance in the transmission band, and a sensor. The bandpass filter is a bandpass filter including a reflective member A and a reflective member B, in which a difference between a reflection center wavelength of the reflective member A and a reflection center wavelength of the reflective member B is larger than a sum of a half width at half maximum of a reflection band of the reflective member A and a half width at half maximum of a reflection band of the reflective member B; the reflective member A has a first cholesteric liquid crystal layer and a second cholesteric liquid crystal layer, and birefringence &#x394;n1 of the first cholesteric liquid crystal layer is larger than birefringence &#x394;n2 of the second cholesteric liquid crystal layer; and the reflective member B has a third cholesteric liquid crystal layer and a fourth cholesteric liquid crystal layer, and birefringence &#x394;n3 of the third cholesteric liquid crystal layer is larger than birefringence &#x394;n4 of the fourth cholesteric liquid crystal layer.

Bandpass filter comprising first and second reflective members each having a plurality of cholesteric liquid crystal layers and sensor having the same

A skin evaluation apparatus includes a shape information acquisition unitthat acquires information on a surface unevenness shape of the skin; an optical feature information acquisition unitthat acquires information on an optical feature of the skin; and an evaluation unitthat evaluates gloss of the skin on the basis of the information on the surface unevenness shape and the information on the optical feature.

Skin evaluation apparatus, skin evaluation method, and skin evaluation program

Provided is an optical member which includes: a substrate; and a laminated structure including two or more kinds of layers having different materials which are disposed on the substrate, in which the number of layers constituting the laminated structure is 10 or more, the maximum layer thickness of the layers constituting the laminated structure is 8 nm or less, and the minimum transmittance in a wavelength range of 400 nm to 800 nm or in a wavelength range of 6 &#x3bc;m to 12 &#x3bc;m is 10% or more.

Optical member

An anti-reflection optical member has a laminated structure including: a transparent substrate having a first refractive index greater than that of a predetermined medium; a metal-microparticle-containing layer containing metal microparticles; and a dielectric layer having a second refractive index greater than that of the predetermined medium, in this order. At least 60% of the metal microparticles are flat particles with a diameter-to-thickness ratio of 3 or more. Principal planes of the flat metal particles are surface-oriented in the range from 0&#xb0; to 30&#xb0; relative to the surface of the metal-microparticle-containing layer. In the metal-microparticle-containing layer, the metal microparticles are disposed without forming a conductive path. The dielectric layer has such a thickness that light reflected at the surface of the dielectric layer of incident light entering the laminated structure from the surface is interfered and canceled by light reflected at the interface between the dielectric layer and the metal-microparticle-containing layer.

Anti-reflection optical member

A multilayer structure including a metal particles-containing layer, a layer A having a refractive index, n1, and a layer B having a refractive index, n2, and satisfying one of the conditions (1-1) and (2-1) is capable of suppressing reflection of light at a wavelength &#x3bb; intended to prevent reflection.1&#x3c;2 and&#x3bb;/4+&#x3bb;/2&#x3c;1&#xd7;1&#x3c;&#x3bb;/2+&#x3bb;/2&#x2003;&#x2003;Condition (1-1)1&#x3e;2 and0+&#x3bb;/2&#x3c;1&#xd7;1&#x3c;&#x3bb;/4+&#x3bb;/2&#x2003;&#x2003;Condition (2-1)wherein m represents an integer of 0 or greater; &#x3bb; represents a wavelength with a unit of nm intended to prevent reflection; n1 represents a refractive index of the layer A; and d1 represents a thickness with a unit of nm of the layer A.

Multilayer structure and laminate structure

A heat ray-shielding material including a metal particle-containing layer containing at least one kind of metal particle. The metal particle contains substantially hexagonal or substantially discoidal metallic flat particles in an amount of 60% by number or more. The main planes of the metallic flat particles are oriented at an angle ranging from 0&#xb0; to &#xb1;30&#xb0; relative to one surface of the metal particle-containing layer.

Heat ray-shielding material

An imaging apparatus, including imaging optical system having a lens group and an aperture stop, and a solid-state image sensor which includes a photoelectric conversion layer made of an organic material and a color filter layer with color filters of two or more colors and a separation wall. The photoelectric conversion layer has a thickness of 0.1 82 m to 1 &#x3bc;m, each of the color filters has a refractive index of 1.5 to 1.8, the separation wall has a width of 0.05 &#x3bc;m to 0.2 &#x3bc;m and a refractive index of 1.22 to 1.34, and the lens group and the solid-state image sensor are disposed such that the relationship between a pixel pitch D (&#x3bc;m) of the sensor and a maximum angle &#x3b1; (&#xb0;) of a principal ray incident on the sensor is 45&#x2267;&#x3b1;&#x2267;25.D&#x2212;20 where D&#x2266;2.6 &#x3bc;m.

Imaging apparatus

A sensor is an optical resonator constituted by: a first reflecting body that exhibits semi transmissivity/semi reflectivity; a transparent body; and a second reflecting body that exhibits one of reflectivity and semi transmissivity/semi reflectivity, provided in this order from the light incident side. The sensor is configured such that the absorption peak of the measuring light beam by resonance in the optical resonator matches the absorption peak of the measuring light beam by local plasmon resonance generated at the surface and/or within the optical resonator. The sensor has absorption properties such that light of specific wavelengths are absorbed depending the mean complex refractive indices of the first and second reflecting bodies and the thickness of the transparent body. An emitted light beam is output from the first reflecting body. The physical properties of the emitted light beam that change according to the absorption properties are detected.

Sensor, sensing system and sensing method

The present invention provides an organic electroluminescence display device including an organic electroluminescence element which includes a transparent electrode, a counter electrode, and an organic compound layer provided between these electrodes, the organic compound layer including a light emitting layer, and a fine particle containing layer positioned in the optical path of light emitted from the light emitting layer, wherein the fine particle containing layer contains an organic resin material, a first fine particle, and a second fine particle having a weight average particle diameter greater than that of the first fine particle, wherein a refractive index nof the organic resin material into which the first fine particle is added and an average refractive index nof the organic compound layer satisfy a relationship |n&#x2212;n|&#x3c;0.25, and wherein the refractive index nand a refractive index nof the second fine particle satisfy a relationship n&#x2212;n&#x3e;0.2.

Organic electroluminescence device

A Raman spectroscopic device includes an optical resonator, in which a first reflecting body that exhibits semi transmissivity/semi reflectivity and has a surface which is a light scattering surface that generates Raman scattering, a transparent body, and a second reflecting body that exhibits reflectivity, are laminated in sequence one on another. The Raman spectroscopic device utilizes light absorption due to resonance to obtain a surface amplified Raman effect.

Spectroscopic device and raman spectroscopic system

In an apparatus for analyzing an electromagnetic field in an analytical space: a range setting unit sets the range of the analytical space; an object-information setting unit sets a distribution-index value indicating the amount of particles distributed in the range, the dimensions of the particles, a first material-property value of a first material of which the particles are formed, and a second material-property value of a second material existing around the particles in the range; a model production unit produces a calculation model of an arrangement in which the particles are arranged at random positions in the range so as to realize the distribution-index value, the dimensions of the particles, the first material-property value, and the second material-property value which are set by the object-information setting unit; and an analysis unit analyzes the electromagnetic field in the range in accordance with the calculation model.

Apparatus and program for analyzing electromagnetic field

A measurement apparatus includes a dielectric block, a thin film layer formed on the dielectric block and brought into contact with a sample, a light source for generating a light beam, an optical incident system for causing the light beam to enter the dielectric block so that the light beam is totally reflected at the interface between the dielectric block and the thin film, and a two-dimensional light detection means for detecting the intensity of the light beam totally reflected at the interface. A predetermined pattern is formed within a region irradiated with the light beam on the dielectric block. The measurement apparatus includes a correction means for correcting an output from the two-dimensional light detection means, based on the pattern, so that an object on the face of the dielectric block is similar to the object detected by the two-dimensional detection means.

Light measurement apparatus measuring two-dimensional physical properties of a sample

A two-photon absorbing optical recording material comprising at least one two-photon absorbing compound and a recording component is provided. Recording is made on it by utilizing the two-photon absorption of the two-photon absorbing compound in the material, and then the material is irradiated with light to thereby detect the difference in the reflectance between the recorded area and the unrecorded area thereof, and the recorded information is thereby reproduced from the material, and also provided are a photosensitive polymer composition and a photon-mode recording method for the material.

Two-photon absorbing optical recording material and two-photon absorbing optical recording and reproducing method

A new and novel sensor having a simple structure with high detection sensitivity. The sensor (S) includes the following from measuring light (L) input side in the order listed below: a first reflector () having semi-transmissive and semi-reflective properties; a translucent body (); and a second reflector () having perfect reflection properties, or semi-transmissive and semi-reflective properties. The first reflector () and/or second reflector is brought into contact with a specimen, and the average complex refractive index varies with the specimen. Absorption properties for absorbing light having a particular wavelength are produced by these components, the properties of the measuring light (L) are changed by the optical properties including the absorption properties, the output light (L) is outputted from the first reflector () and/or second reflector (), and the physical properties of the output light (L) that vary according to the optical properties are detected.

Growing community of inventors

Kanagawa, Japan

Takeharu Tani