Nec Corporation

Takazumi Kawai

Shizuka Sato

Yoshiyuki Miyamoto

Katsuhiro Ochiai

An information processing apparatus according to the present invention includes: a prediction value calculation unit configured to, based on a model calculating an objective variable representing a state of a target by using a plurality of explanatory variables, for each of the explanatory variables, calculate a prediction value of the explanatory variable that changes based on a value of the explanatory variable at a predetermined moment; and a change quantity calculation unit configured to, for each of the explanatory variables, calculate a quantity of change of the objective variable with change of the explanatory variable by using the prediction value of the explanatory variable and the model.

Information processing apparatus

An information processing device according to the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations includes: extracting a feature of a period or a frequency in a plurality of pieces of time-series data acquired by measuring an object; classifying the pieces of time-series data into a group related to the feature; generating, for each of the groups, a model that represents a relationship among the pieces of time-series data classified into the group; and selecting the model in which strength of the relationship satisfies a predetermined condition.

Information processing device, information processing method, and recording medium

An anomaly detection device includes: at least one memory configured to store instructions; and at least one processor configured to execute the instructions to: cluster a plurality of power storage systems into a plurality of clusters; generate a detection model for detecting an anomaly in the power storage systems for each of the clusters; and detect an anomaly in the power storage system for each of the clusters by using the detection model associated with the cluster.

Anomaly detection device, anomaly detection method, and recording medium

Provided is a manufacturing process analysis device (), comprising: a computation unit () which computes, in a process in which a manufactured object is manufactured, invariant compliance strengths for each shift time for manufacturing condition values () and quality values () which are measured in time series; a shift time specification unit () which derives, as a specified shift time, a shift time for which the invariant compliance strengths satisfy a baseline; and an analysis unit () which analyzes the state of the manufacturing process on the basis of the quality value and the manufacturing condition value for the time which is earlier by the specified shift time than the time at which the quality value is measured.

Manufacturing process analysis device, manufacturing process analysis method, and recording medium whereupon manufacturing process analysis program is stored

The present invention provides a method of selectively extracting metallic armchair carbon nanotubes alone from the mixture of carbon nanotubes of mixed chiralities, wherein vacant lattice defects are removed from armchair carbon nanotubes alone using the fact that the vacant lattice defects of zigzag carbon nanotubes are hard to diffuse in the axial direction of nanotubes compared with those of armchair carbon nanotubes. Since vacant lattice defects remaining on zigzag carbon nanotubes are active, the tube structures are easily destroyed and decomposed by oxidation etc. Thus it is possible to extract armchair carbon nanotubes alone from the mixture of carbon nanotubes of mixed chiralities.

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Tokyo, Japan

Takazumi Kawai