Mitsubishi Electric Corporation

Takayuki Yanai

Masahiro Nakajima

Yuki Iwagami

Masanori Kurimoto

Yoshitake Nishiuma

Ryo Miyashita

Tomoki Yamamoto

A data transmitting device includes: a judge code generating portion for transmitting a plurality of times a predefined code pattern indicating a head portion of transmission data, as a judge code; a start code generating portion for transmitting at least once a start code having a predefined code pattern different from the judge code, following the judge code; and a valid data generating portion for transmitting valid data, following the start code. After receiving the judge code for a predetermined number of times that is less by at least one than the number of times that the judge code is transmitted, a data receiving device enters a standby state for receiving the start code, and, after receiving the start code, receives the valid data.

Data transmitting/receiving apparatus and data transmitting/receiving method

Even when parts having individual differences among identical parts or differences in deterioration speed between parts, or a part that does not have a non-volatile memory such as an EEPROM in a chip of the part itself, are mixed, there is no deterioration diagnosis device that can appropriately diagnose a state of deterioration due to temporal change or the like, because of which a mechanism (correction methodology) for evaluating and correcting deterioration in the precision or performance of an electronic part that has low precision or considerable temporal deterioration, and does not have a correction function, is incorporated in a deterioration diagnosis device, and a deterioration state is diagnosed using incorporated deterioration determination means when using a product after shipping.

Deterioration diagnosis device

Correction coefficients corresponding to parameters by which characteristic variation is caused are stored in a data memory of a second integrated circuit element in which driving open/close elements respectively connected in series to a plurality of inductive loads are integrated, and a first integrated circuit element that cooperates with the second integrated circuit element suppresses a current control error accompanying individual variation among circuit components and environmental temperature variation by reading present values of the parameters and combining the present values with the correction coefficients. The correction coefficients are calculated by an adjustment tool in a state where the second integrated circuit element is provided singly, and therefore correction data can be generated in relation to a plurality of temperature environments easily.

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Tokyo, Japan

Takayuki Yanai