Fuji Photo Optical Co., Ltd.

Fujinon Corporation

Takayuki Saito

Hideo Kanda

Zongtao Ge

Noboru Koizumi

Toshiaki Katsuma

Nagaaki Ohyama

Toshio Honda

Tomohiko Hattori

Masami Yoneda

Masahiro Yamaguchi

Katsuo Katagiri

Kei Shimura

Minoru Kurose

Masatoshi Hizuka

The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light composed of a plane wave is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.

Optical wave interference measuring apparatus

The relative position of a test surface is sequentially changed from a reference position where a surface central axis is aligned with a measurement optical axis such that the measurement optical axis is sequentially moved to a plurality of annular regions obtained by dividing the test surface in a diametric direction. The test surface is rotated on a rotation axis whenever the relative position is changed. Measurement light that travels while being converged by a Mirau objective interference optical system is radiated to the rotating test surface, and a one-dimensional image sensor captures interference fringes at each of a plurality of rotational positions. The shape information of each annular region is calculated on the basis of the captured interference fringes at each rotational position, and the shape information is connected to calculate the shape information of the entire measurement region.

The light beam measurement apparatus comprises a beam splitter that divides a light beam emitted from a light source unit into two luminous fluxes, a semi-transmitting/reflecting surface that reflects part of one of the divided luminous fluxes back in the opposite direction to the direction of incidence as a sample luminous flux, and reflection-type reference light producing means that converts part of the luminous flux transmitted through the semi-transmitting/reflecting surface into a wavefront-shaped reference luminous flux and outputs this reference luminous flux; this light beam measurement apparatus can carry out both wavefront measurement and light beam spot characteristic measurement on a light beam simultaneously.

Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof

In a speckle interferometer apparatus, an optical member mounting devicemounted with optical members including a pair of luminous flux outputting devicesis disposed on the object side of a main unit of an imaging devicewhile being separated from the imaging device. A light-transmitting areais formed between the pair of luminous flux outputting devicesso as to transmit therethrough interference light from an object surface.

Speckle interferometer apparatus

In an optical pickup apparatus which can be commonly used for a plurality of optical disks having different thickness values, thickness t of a optical transparent plane plate for thickness compensation is set by means of skew ray formula so that the amount of spherical aberration caused by the optical system is lowered, thus allowing accurate focusing for each of a plurality of optical disks having different thickness values. Spherical aberration S.A. is given by expression of S.A..ident.S'.sub.k -S'.sub.k0, wherein S'.sub.k is computed by expression of S'.sub.k =Ax.sub.k -(X'.sub.k /Y'.sub.k)Ay.sub.k. Here, by setting S'.sub.k -S'.sub.k0 =minimal value, the geometric thickness of the plane plate 8 can be determined.

Optical pickup apparatus

In an apparatus for displaying a three-dimensional image, an image display and a polarizing filter having an axis of easy transmission in a predetermined direction or an optically-active film having an optically-active portion at a predetermined position are combined together in a predetermined positional relationship, thereby easily displaying an image on the image display when a flat original image is prepared for forming the three-dimensional image and simplifying the structure of the apparatus with a reduced manufacturing cost. The apparatus for three-dimensionally displaying a planar image recorded on a polarizing film comprises a monochrome liquid crystal television screen which functions as a backlight source, a convex Fresnel lens for magnifying an image of the backlight source, an infrared illumination light source for illuminating a half of the face of an observer with infrared radiation, an infrared camera for capturing the illuminated image of the observer, and an interlaced-image synthesizing circuit which forms a binary-coded image obtained by the infrared television camera and its reversed image and interlaces the binary-coded image and reversed image to synthesize a signal.

Polarizing films used for optical systems and three-dimensional image

A beam shifting device for directing a beam toward a fixed point of an object has instance vertical and horizontal beam shift elements, such as transparent optical plates with parallel surfaces positioned in an intended optical path. The vertical beam shift parallel plate is able to turn about a horizontal axis perpendicular to the optical axis for vertically shifting the beam upward and downward. The horizontal beam shift parallel plate, positioned in parallel with the vertical beam shift parallel plate, is able to turn about a vertical axis perpendicular to the optical axis for horizontally shifting the beam left and right. A controller detects vertical and horizontal deviations of the beam based on a distribution pattern of relative luminous energy of the beam diverged onto a spatial plane perpendicular to the intended path and drives the vertical and horizontal beam shift parallel plates to cancel the vertical and horizontal deviations of the beam, respectively.

Beam shifting device

The present invention provides a method and apparatus for producing a hologram from a series of two-dimensional images horizontally different in line of sight from each other. The holographic apparatus employs original images produced by photographing an object from different directions, an object optical system which makes a light be incident upon original image to project an object beam onto photo-sensitive material, and a reference optical system which projects a reference beam of a same wavelength as the object beam toward the photo-sensitive material. The horizontal component of the object beam can be converged at a rear point i.e., a point of view at image reproduction, relatively distant from the photo-sensitive material on which a hologram is produced. When the hologram is reconstructed, a beam having the same wavelength as when recorded is converged at the rear point of view, so that the reconstructed image can be viewed in a same color free from any color shading.

Growing community of inventors

Saitama, Japan

Takayuki Saito