Mitsubishi Heavy Industries Limited

National Institute of Advanced Industrial Science and Technology

Takayuki Numata

Takeshi Kaneko

Toshiya Watanabe

Ryuichi Narita

Misaki Fukuyama

A laser light profile measuring device of the present disclosure includes a reflection attenuation part reflecting and attenuating at least part of laser light incident from a first direction in a direction different from the first direction to generate measurement target laser light traveling in the first direction, a capture unit placed on one side of the reflection attenuation part in the first direction and which captures the measurement target laser light, a cooling body covering at least part of the reflection attenuation part and the capture unit in a circumferential direction with respect to the first direction, a refrigerant supply unit forcibly feeding a refrigerant toward the cooling body, and a rotation support part supporting the reflection attenuation part, the cooling body, and the refrigerant supply unit to be rotatable around a rotation axis extending in a horizontal direction.

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Ibaraki, Japan

Takayuki Numata