Other

Fuji Xerox Co., Ltd.

Opnext Japan, Inc.

Cig Photonics Japan Limited

Takayuki Nakao

Tomoaki Shimotsu

Yasuhiro Yamada

Tadashi Hatano

Tomonao Kikuchi

Toshiaki Murai

Akihiro Hayami

Hidehiro Ikeuchi

Tohru Oyama

Tadaaki Fujii

Masayuki Miyoshi

Daisuke Noguchi

Atsushi Hasegawa

Keiichi Yamamoto

Norio Chujo

Katsunori Hirano

Takeshi Yamashita

Tetsuya Aoki

Akio Osaki

Tsunaki Tsuji

Ligang Liao

Masanori Shiba

Junichiro Jimbo

Satoshi Hanamura

The metallization pattern includes a pair of first metal films on the respective pair of first surfaces, and a second metal film on the pair of second surfaces to connect the pair of first metal films. The support block includes a connection conductor connecting the pair of first metal films, the connection conductor being a castellation conductor and/or a via conductor, the castellation conductor being on the pair of third surfaces of the ceramic body, the via conductor being through the ceramic body between the pair of first surfaces. The mounting substrate is mounted on one of the pair of first surfaces. One end of the first wire is bonded to a corresponding one of the pair of first metal films or the connection conductor, at a position adjacent to or overlapping with the connection conductor, on another of the pair of first surfaces.

Optical module

There is provided an image forming apparatus. A reception unit receives a change of a printing setting for each page in a case where, in a printing setting is designated for printing data that is made up of a plurality of pages, a page on which printing processing is impossible to perform is included in the printing data. An output unit outputs the printing data according to the printing setting that is received by the reception unit.

Image forming apparatus and non-transitory computer readable medium

A sample & hold type phase detector is used in a CDR IC and, in jitter transfer bandwidth adjustment, VCO output waveforms 90&#xb0; out of phase with each other can be inputted to the phase detector, whereby a jitter transfer bandwidth can be calculated by only the measurement of frequency and of a DC voltage and it is possible to make a jitter transfer bandwidth adjustment in DC test for IC.

Optical modules and methods of making the optical modules

A temperature compensating circuit includes a first circuit network between an inverting input terminal of an operational amplifier and an output terminal of the operational amplifier , and a second circuit network between the inverting input terminal of the operational amplifier and a reference potential. At least one of the first circuit network and the second circuit network is made of an arrangement containing a plurality of series-connected thermistor/resistor pairs in which the thermistors are connected parallel to the resistors, and the temperature compensating circuit compensates a temperature-dependent signal which is inputted into a positive phase input terminal of the operational amplifier , and outputs the temperature-compensated signal.

Temperature compensating circuit, temperature compensating logarithm conversion circuit and light receiver

Growing community of inventors

Yokohama, Japan

Takayuki Nakao