Rohm Co., Ltd.

Takayuki Matsuura

Shinji Kawata

Yoshiyuki Nakatani

Yuichi Kokusho

Ryosuke Sumii

Katsuhiro Oshikawa

A self-diagnosis circuit (BST) configured to diagnose a fault detection circuit () including a first comparator (CMP) configured to be fed with a voltage based on a fault sensing target voltage (Vo) and a first reference voltage (Vref) includes a voltage switch circuit () configured to switch the level of a voltage based on a second reference voltage (Vref) and output the resulting voltage, a first path switch circuit () configured to switch between a path through which the voltage output from the voltage switch circuit is fed to the first comparator and a path through which the voltage based on the fault sensing target voltage is fed to the first comparator, and a control circuit () configured to control the voltage switch circuit and the path switch circuit.

Self-diagnosis circuit and semiconductor device

A monitoring device includes a monitoring part configured to detect an abnormality of a monitoring target, a self-diagnosis part configured to diagnose whether or not the monitoring part operates normally during a period from a startup time point of a power supply to an elapse time point at which a reset release waiting time elapses, and a reset control part configured to release a reset of a reset output signal on or after the elapse time point.

Growing community of inventors

Kyoto, Japan

Takayuki Matsuura