Omron Corporation

Takatoshi Katahata

Atsushi Shimizu

Hirotaka Wada

Akira Nakajima

Reiko Hattori

Yuya Ota

Toshihiro Moriya

Yuki Hirohashi

An information management device includes: a first data storage unit which stores first data relating to at least one of data on equipment and operation behavior data concerning the equipment up to occurrence of an event; an event information generation unit which classifies the event on the basis of the first data and generates event information associated with the first data; a second data storage unit which stores second data in which the data on the equipment encompassing before and after maintenance work in response to the event is associated with maintenance behavior data concerning the equipment; a maintenance information generation unit which associates the event information with the second data and generates maintenance information corresponding to each piece of event information; and a maintenance information storage unit which stores the generated maintenance information.

Information management device and information management method for classifying event occurred in equipment and generating maintenance information

In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.

Board inspection apparatus and method and apparatus for setting inspection logic thereof

Growing community of inventors

Soraku-gun, Japan

Takatoshi Katahata