Ricoh Company, Ltd.

Kanagawa Academy of Science and Technology

Other

The University of Tokyo

V Technology Co., Ltd.

Hoden Seimitsu Kako Kenkyusho Co., Ltd.

Takashi Yatsui

Motoichi Ohtsu

Motonobu Kourogi

Junichi Takahashi

Masato Takada

Michinobu Mizumura

Koji Yamamoto

Koichi Kajiyama

Toshiyuki Inokuchi

Keiichi Ito

Izumi Itoh

Shuji Mononobe

Taroh Terashi

Tadashi Kawazoe

Shunsuke Yamazaki

Provided is a compound semiconductor deposition method of adjusting the luminous wavelength of a compound semiconductor of a ternary or higher system in a nanometer order in depositing the compound semiconductor on a substrate. In the compound semiconductor deposition method of depositing a compound semiconductor of a ternary or higher system on a substrate, propagation light of a smaller energy than a desired ideal excitation energy for the compound semiconductor is irradiated onto the substratewhile depositing the compound semiconductor on the substrate, near-field light is generated based on the irradiated propagation light from fine particles of the compound semiconductor deposited on the substrate, new vibrational levels for the compound semiconductor are formed in multiple stages based on the generated near-field light, and a component in the compound semiconductor corresponding to the excitation energy is excited with the propagation light through a vibrational level, among the new vibrational levels, which has an excitation energy equal to or smaller than the energy of the propagation light is excited to desorb the component.

Compound semiconductor deposition method and apparatus

An optical detection device image is disclosed that allows fast measurements using near-field light at high resolution and high efficiency but without necessity of position alignment of an optical fiber probe. The optical detection device includes an optical fiber probe having a core for propagating light with an optical probe being formed at a front end of the core; a movement control unit to move the optical fiber probe to approach or depart from a sample; and a detection unit to detect light from the sample surface, wherein on the front end surface of the core of the optical probe, there are a first exit section on a peripheral side for emitting propagating light and a second exit section for seeping out the near-field light, the first exit section and the second exit section are formed in a concentric manner, and the tilt angle of the first exit section is different from the tilt angle of the second exit section.

Optical fiber probe, optical detection device, and optical detection method

The broad range measurement exploiting the usual propagated light and the high resolution measurement mode exploiting near-field light are to be accomplished with a sole as-assembled optical probe. To this end, light radiated through an optical probehaving a light shielding coating layerformed for defining a light radiating aperture D or light radiated at a coreof the optical probeis propagated, as the optical probeis moved in a direction towards and away from a surface for measurement. The core of the optical probe is coated with a light shielding coating layerIn this manner, a spot of propagated light propagated through the coreor a spot of near-field light seeping from the light radiating aperture D is formed on the surface for measurement, and light derived from the spot of light is detected.

Photo-detection device and method

An optical-pickup slider is characterized in that a light-transmitting-property substrate is bonded to a surface of a layer having a tapered through hole, on which surface a larger opening of the tapered through hole exists. Thereby, it is possible to prevent the layer having an aperture from being destroyed. A method of manufacturing the optical-pickup slider comprises the steps of a) making a tapered through hole in a layer layered on a first substrate and having a thickness smaller than that of the first substrate; and, after bonding a light-transmitting-property substrate to a surface of the layer, removing the first substrate so as to expose an aperture at a tip of the tapered through hole.

Optical-pickup slide, manufacturing method thereof, probe and manufacturing method thereof, and probe array and manufacturing method thereof

Method of manufacturing a probe array

Optical-pickup slider, manufacturing method thereof, probe and manufacturing method thereof, and probe array and manufacturing method thereof

Growing community of inventors

Kanagawa, Japan

Takashi Yatsui