Renesas Electronics Corporation

Takashi Yasumasu

Nobuyasu Kanekawa

Hiromichi Yamada

Kesami Hagiwara

Yuichi Ishiguro

Kazuyoshi Fukuda

Tsutomu Yamada

Teruaki Sakata

Hideki Matsuyama

Yoshiyuki Nakada

Hitoshi Arimitsu

The present invention provides a microcontroller which can continue operation even at the time of a failure without making a memory redundant to suppress increase in chip area. The microcontroller includes three or more processors executing the same process in parallel and a storage device. The storage device includes a memory mat having a storage region which is not redundant, an address selection part, a data output part, and a failure recovery part. The address selection part selects a storage region in the memory mat on the basis of three or more addresses issued at the time of an access by the processors. The data output part reads data from the storage region in the memory mat selected by the address selection part. The failure recovery part corrects or masks a failure of predetermined number or less which occurs in the memory mat, the address selection part, and the data output part.

Microcontroller utilizing redundant address decoders and electronic control device using the same

A microcontroller includes a central processing unit, a PWM signal generation unit which generates a PWM signal according to a generation condition of a PWM signal set by the central processing unit, and a diagnostic unit which inputs the generated PWM signal therein and detects a pulse period and a pulse width, based on the input signal and which determines whether the detected pulse period and pulse width respectively coincide with a pulse period and a pulse width corresponding to the generation condition.

Microcontroller, control device and determination method

To have a problem of occurrence of the same failure in failure detection of a microcontroller. A microcontroller has a CPU and a data access control circuit. The data access control circuit performs two types of accesses: an individual access in which a data access of the CPU is performed for each thread, and a shared access in which a data access of the CPU is performed by executing two threads. The data access control circuit detects a failure of the CPU by making a comparison between the command and the address, respectively, in the shared access generated by executing the two threads.

Semiconductor integrated circuit device and microcontroller

Growing community of inventors

Kanagawa, Japan

Takashi Yasumasu