Sysmex Corporation

Toa Medical Electronics Co., Ltd.

Takashi Yamato

Hiroshi Kurono

Norimasa Yamamoto

Nobuhiro Kitagawa

Naohiko Matsuo

Satoshi Iguchi

Hiroki Koike

Masanori Imazu

Daisuke Nakano

Hironori Katsumi

Kazuya Fukuda

Tsuyoshi Fukuzaki

Masayuki Ikeda

Akio Toyoda

Tsuyoshi Kurosaki

Jun Inagaki

Shuji Kawaguchi

Yoshinori Nakamura

Atsuo Tomioka

Hisashi Nakatsuka

Shunsuke Saito

The sample measuring apparatus includes a suction unit that includes a nozzle and a drive unit that raises and lowers the nozzle, and suctions a first liquid and a second liquid that is different from the first liquid; a liquid surface detecting unit that detects liquid surfaces of the first liquid and the second liquid; a control unit that controls the suction unit, and a measuring unit that measures a measurement sample prepared from the suctioned first liquid; wherein the control unit controls the suction unit to suction the first liquid and the second liquid based on the respective liquid surface detection result of the first liquid and the second liquid detected while lowering the nozzle, and a second speed at which the nozzle descends when detecting the liquid surface of the second liquid is faster than a first speed at which the nozzle descends when detecting the liquid surface of the first liquid.

Sample measuring apparatus and sample measuring method

A sample analyzer is configured to execute a liquid surface detection of detecting a liquid surface in a container by a liquid surface detector prior to a lowering operation of an aspirating tube for aspirating the liquid if a liquid level information is not stored in a memory, and store a liquid level information of a container in the memory based on a detection result by the liquid surface detection. Also, a liquid aspirating method by a sample analyzer.

Sample analyzer and liquid aspirating method

A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container () and sampling it in a first container (), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container () and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.

Specimen analyzing method and specimen analyzing apparatus

Sample analyzer with liquid aspirating unit and liquid surface detector

A specimen processing apparatus comprising: a specimen processing section which includes a movable section and processes a specimen by moving the movable section; and a controller for determining whether the movable section was moved while a specimen processing operation by the specimen processing section was stopped, and controlling the specimen processing section to perform a preparing operation for starting the specimen processing operation based on the determination result, is disclosed. A control method for a specimen processing apparatus is also disclosed.

Specimen processing apparatus that determines whether a moveable section was moved when a moving operation had been stopped

A sample processing apparatus includes a sample processing unit for obtaining a sample from a sample container and performing a predetermined process of the sample; a transport unit which includes a transport region for transporting, in a transport operation, a sample rack holding the sample container to the sample processing unit, and a rack removal region where the sample rack is accessible to an operator. A restraining member is also provided, which restrains contact by the operator to the sample rack on the transport region. A transport controller controls the transport unit to transport the sample rack on the transport region to the rack removal region after a predetermined transport suspension event occurs during the transport operation.

Sample processing apparatus

A specimen analyzing apparatus for measuring a specimen by using a reagent which has a dispensing mechanism which includes a dispensing tube for suctioning and discharging liquid; a reagent container holder from which a reagent container is removable when the reagent container is in a container removal area; a receiving section for receiving a replacement command for a replacement of the reagent; and a controller for controlling the dispensing mechanism so as to retreat the dispensing tube from the container removal area when the replacement command has been received by the receiving section. Also, a control method for a specimen analyzing apparatus.

Analyzing apparatus

An apparatus for generating throughput information of a sample analyzer is disclosed. Specifically, this apparatus generates throughput information of a sample analyzer capable of measuring a sample on a plurality of measurement items in which measurement time differs from each other. The apparatus receives an input of a plurality of measurement orders, wherein a measurement order includes a designation of at least one measurement item, generates the throughput information of the sample analyzer based on the received plurality of measurement orders; and outputs the generated throughput information.

Throughput information generating apparatus of sample analyzer, sample analyzer, throughput information generating method of sample analyzer, and computer program product

A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount greater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.

Specimen analyzing apparatus and specimen analyzing method

A sample processing apparatus, including: a sample processing unit for obtaining a sample from a sample container positioned at a sample obtaining position and performing a predetermined process of the sample; a transport unit for transporting a sample rack holding the sample container via the sample obtaining position; and a transport controller for performing a stop process to stop the transport operation of the sample rack by the transport unit when a transport suspension event has occurred during the transport operation of the sample rack, and for controlling the transport unit to restart the transport operation of the sample rack from a stop position at which the sample rack has been stopped by the stop process.

Sample processing apparatus and sample rack transporting method

A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount grater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.

A sample analyzer is disclosed that comprising: a light source section for emitting light; a first optical information acquiring section for illuminating a sample with the light emitted by the light source section, and for acquiring first optical information; and a second optical information acquiring section for illuminating a measurement specimen, to be prepared by adding a reagent to the sample, with the light emitted by the light source section, and for and acquiring second optical information. A sample analyzing method, intended for use in an automated sample analyzer, is also described.

Growing community of inventors

Kakogawa, Japan

Takashi Yamato