Sony Corporation

Mitsubishi Denki Kabushiki Kaisha

Renesas Electronics Corporation

Renesas Technology Corp.

Takashi Nasu

Katsuyoshi Watanabe

Mamoru Sakugawa

Tsutomu Kumagai

Tomohiro Sakurai

Shunichi Iwata

Takuji Ohkubo

Fumitaka Fukuzawa

Masahiro Saito

Katsuhiro Yamashita

Kazuya Terasaki

Masashi Yamada

Tadashi Sakamoto

Yoshihisa Wada

Motohisa Haga

Kei Yamaoka

Shigekuni Dewa

Tadayoshi Nakano

There is a need to provide a microcomputer capable of eliminating an external terminal for endian selection. Flash memory includes a user boot area for storing a program executed in user boot mode and corresponding endian information and a user area for storing a program executed in user mode and corresponding endian information. A data transfer circuit reads endian information stored in the user boot area or the user area in accordance with operation mode and supplies the endian information to a CPU before reset release of the CPU. Accordingly, an external terminal for endian selection can be eliminated.

Microcomputer having processor capable of changing endian based on endian information in memory

A sealed lamp device may include a discharge lamp burner; a concave mirror opened to a front direction and reflecting radiation light of the discharge lamp burner to the opened side, an optical axis of the concave mirror being aligned with an optical axis of the discharge lamp burner; a hollow casing structure having an opening section in a front side, to which the concave mirror opened out; and a front plate closing the opening section of the hollow casing structure and emitting the radiation light. The hollow casing structure may be made wider than an opening width of the concave mirror, so as to increase a sealed volume occupied by the discharge lamp burner.

Sealed lamp device and projector

The present invention provides a projection type display unit including a light source, an optical unit including a light valve and a projection lens, and a cooling section for cooling the light source and the optical unit. The light source and the optical unit as well as the cooling section are incorporated in an armor cabinet. A highly heat conductive sheet metal component part is disposed in a space between a lamp as the light source and the armor cabinet.

Projection type display unit having a thermal damping housing

A liquid crystal display device constrains the injection of air bubbles in a cooling fluid into a display panel. In the display device, the cooling fluid is supplied to a receiving space of a receiving unit placed and opposed to a surface of a liquid crystal panel to which the light is emitted from a light source to thereby cool the liquid crystal panel. Namely, by a cooling fluid pump, the cooling fluid received in the receiving unit is drained from a drain port and the cooling fluid is supplied from a feed port to the receiving unit and received in the receiving space. In the above case, a part of a flow path of the cooling fluid supplied from the feed port is blocked by a flow path block unit placed and opposed to the feed port to thereby disperse the flow thereof around the flow path block unit.

Liquid crystal display apparatus and cooling device

An output voltage of a VDC circuit is subjected to A/D conversion with an on-chip A/D converter. Accordingly, an output voltage VDCout of the VDC circuit can be observed as a digital value, which facilitates measurement. Reduction in the number of terminals leads to reduction in chip size. In addition, the terminal that has been used for providing voltage VDCout can be used for other purposes. Therefore, a semiconductor integrated circuit allowing for easy mass production test and reduced number of man-hours in the mass production test can be provided.

Semiconductor integrated circuit in which voltage down converter output can be observed as digital value and voltage down converter output voltage is adjustable

A microcomputer comprises a serial interface for receiving a debugging program applied thereto from a debugging tool, a register for holding an instruction code included with the debugging program, which is applied to the microcomputer via the serial interface, and a central processing unit or CPU for executing the instruction code held by the first register to debug the microcomputer. The microcomputer can further comprise a buffer for holding one or more instruction codes supplied thereto from the register. The CPU can execute each of the plurality of instruction codes held by the buffer. Preferably, the serial interface is a JTAT (Joint Test Action Group) interface.

Microcomputer which can execute a monitor program supplied from a debugging tool

A microcomputer of the present invention permits a direct control of a rewrite operation on an internal flash-memory to enhance the efficiency of a debugging operation. The microcomputer has a first storage means that stores a program for rewriting data into an internal flash memory, a second storage means that stores internal flash information about the internal flash memory, an interface that makes a connection to a debugging tool, and a CPU. The CPU allows reading of the internal flash information by the debugging tool through the interface, receiving of write data based on the internal flash information from the debugging tool through the interface, and rewriting of the write data as new contents into the internal flash memory in accordance with the program for rewriting data into the internal flash memory.

Microcomputer including program for rewriting data in an internal flash memory

Correct and accurate evaluation as to which portion of a program to be subjected to rate performance evaluation takes much time is disclosed. Program counters (101c, 101d) hold instructions in simulation of a simulation engine (101). An instruction execution count and a cumulative clock cycle count required for the execution are arranged for the same instruction and stored in an execution count storage array (102b) and a cumulative clock cycle count storage array (102c), respectively. The execution count of the same instruction and the cumulative time required for the execution thereof are determined.

Growing community of inventors

Tokyo, Japan

Takashi Nasu