Average Co-Inventor Count = 1.63
ph-index = 5
The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.
Company Filing History:
1. Seiko Epson Corporation (16 from 33,404 patents)
2. Toyota Jidosha Kabushiki Kaisha (1 from 36,499 patents)
3. Japan Science and Technology Agency (1 from 1,309 patents)
4. Japan Advanced Institute of Science and Technology (1 from 35 patents)
18 patents:
1. 10461337 - Oxide all-solid-state battery
2. 8673682 - High order silane composition and method of manufacturing a film-coated substrate
3. 8105870 - Method for manufacturing semiconductor device, semiconductor device, semiconductor circuit, electro-optical device, and electronic apparatus
4. 8038972 - Higher order silane composition, method for manufacturing film-coated substrate, electro-optical device and electronic device
5. 8017936 - Electric device, method of manufacturing electric device and electric apparatus
6. 7883165 - Droplet information measuring method and apparatus therefor, film pattern forming method, device manufacturing method, droplet discharge apparatus, electro-optical apparatus, and electronic apparatus
7. 7601279 - Organic semiconductor composition containing cis-decalin
8. 7601386 - Process for forming a film, process for manufacturing a device, electro-optical device and electronic equipment
9. 7521299 - Method of manufacturing transistor, method of manufacturing electro-optical device, and method of manufacturing electronic device
10. 7510093 - Method of manufacturing a wiring substrate, method of manufacturing an electro-optical device, method of manufacturing an electronic apparatus
11. 7504709 - Electronic device, method of manufacturing an electronic device, and electronic apparatus
12. 7485347 - Method of forming a film with linear droplets and an applied temperature gradient
13. 7479362 - UV decomposable molecules and a photopatternable monomolecular film formed therefrom
14. 7438944 - Droplet information measuring method and apparatus therefor, film pattern forming method, device manufacturing method, droplet discharge apparatus, electro-optical apparatus, and electronic apparatus
15. 7393553 - Droplet information measuring method and apparatus therefor, film pattern forming method, device manufacturing method, droplet discharge apparatus, electro-optical apparatus, and electronic apparatus