Mitsubishi Denki Kabushiki Kaisha

Nippon Telegraph and Telephone Public Corporation

Omnivision Semiconductor (shanghai) Co., Ltd.

Takashi Kozakai

Ming Zhang

Regis Fan

Libo Weng

Kishio Arita

Hiroji Tanaka

Susumu Mitani

Yoshitaka Koide

Yoshio Habuka

Haruzi Sato

Yoshikazu Sudo

Hideo Sakai

A liquid crystal on silicon (LCOS) display device and an electronic device are disclosed. The LCOS display device includes a wafer substrate and a pixel electrode layer over the wafer substrate. The pixel electrode layer comprises a plurality of pixel electrodes, and a reflector stack or at least a stack comprised of, stacked vertically downward, a first high refractive index insulating layer and a first low refractive index insulating layer is arranged between every adjacent two pixel electrodes. By arranging the reflector stacks or stacked layers (in the gaps) between adjacent pixel electrodes, the gaps exhibit higher reflectivity and produce less diffraction noise.

LCOS display device and electronic device

In an ultrasonic inspecting apparatus, propagation time is measured between a transmitting point of an ultrasonic wave from outer circumference of a subject material and a receiving point of the ultrasonic wave at another point on the outer circumference spaced apart from the transmitting point by a predetermined angle, and a predetermined sequence of operations is performed with the measured propagation times and the known constants, thereby internal information concerning the material, including location and shape of a defect existing therein, is provided.

Ultrasonic inspecting apparatus

Growing community of inventors

Kanagawa, Japan

Takashi Kozakai