Hitachi, Ltd.

Takashi Kotera

Yukio Nakano

Masashi Tsuchida

Shohei Matsuura

A data analysis method for analyzing data on a data analysis apparatus having: setting, a plurality of dimension tables each having a first identifier for identifying data to be analyzed and attributes corresponding to the first identifier; setting, a history table having a second identifier associated with each of the first identifiers of the dimension tables, and having attributes corresponding to the second identifier; setting, a relation table for storing attributes relating to the first identifier, the dimension tables having a first dimension table associated with the relation table through the attribute relating to the first identifier; associating, the first identifiers that refers to the first identifier of a first dimension table with the attributes; and processing, a query for the relation table and the first dimension table, and generating a second dimension table.

Growing community of inventors

Tokyo, Japan

Takashi Kotera