Jfe Steel Corporation

Sony Corporation

Jfs Steel Corporation

Jfe Techno-research Corporation

Takashi Iwama

Kentaro Sato

Kayo Tokieda

Kohtaro Sabe

Osamu Shimizu

Yuji Yamasaki

Takanobu Saito

Eiichi Shiraishi

Takayuki Futatsuka

Takashi Taniguchi

Masashi Takiguchi

Akihide Yoshitake

Kazunari Yoshitomi

Yuhei Akiyama

Shohei Shinozuka

Shinji Sakurai

Mitsuaki Uesugi

Yukiko Hata

Youiti Komatu

Hiroshi Kamitani

An object is to closely observe, by means of images of a camera having high performance specifications, changes in a structure due to heating or cooling of the structure to a temperature beyond a service temperature limit of the camera having high performance specifications and returning from that temperature to room temperature. A structure observation device includes: a camera case of a rectangular three-dimensional shape, having a glass window of heat-resistant and/or cold-resistant glass on at least one side of the three-dimensional shape; heat insulating walls covering the camera case except for the glass window; a fluid supply port and a fluid discharge port through which a cooling or warming fluid is circulated into; and a camera that is disposed inside the camera case and captures a still image or a moving image through the glass window and externally outputs or internally stores data of the captured image.

Structure observation device and observation method

An information processing apparatus includes an electric power related information obtaining unit mounted on or connected to equipment and configured to obtain electric power related information with regard to the equipment and a communication unit configured to transmit the electric power related information obtained by the electric power related information obtaining unit to a rebate processing apparatus connected via a network. A rebate processing apparatus includes a communication unit configured to receive electric power related information transmitted from an information processing apparatus mounted on or connected to equipment via the network, a rebate reference calculation unit configured to calculate a rebate reference functioning as a reference for a rebate processing on the basis of the electric power related information, and a rebate processing unit configured to perform a predetermined rebate processing on the basis of the rebate reference.

Reducing electric energy consumption based on energy usage pattern

A method of measuring panel stiffness of an automobile part outer panel by pushing an indenter onto a surface of the panel in a pushing direction intersecting the surface under a load to deform the panel and measuring deformation of the panel includes arranging grids in a lattice form to a surface of a site of the panel; arranging markers previously knowing three-dimensional position information on a periphery of the site; pushing the indenter onto the surface of the site under the load and moving the indenter in a direction perpendicular to the pushing direction, during which the grids on the surface deformed by loading of the indenter are simultaneously and repeatedly shot from plural positions by plural cameras; and calculating position information of the grids corresponding to the markers based on the image data to measure change in deformation of the panel associated with movement of the indenter.

Method and apparatus for measuring dynamic panel stiffness of outer panel for automobile parts

A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying meanscapable of switching and displaying a plurality of kinds of light-and-shade patterns, capturing meansfor capturing mirror images, reflected in the specular or semi-specular surface of a measurement target, of the plurality of light-and-shade patterns displayed on the pattern displaying means, and surface-distortion distribution calculating meansfor performing image processing on the captured mirror images of the plurality of light-and-shade patterns to calculate surface-distortion distribution of the measurement-target surface.

Surface-distortion measuring device and method

Growing community of inventors

Tokyo, Japan

Takashi Iwama