Sharp Kabushiki Kaisha Corporation

Takashi Horiyama

Tsuyoshi Muramatsu

Atsushi Yamashita

Toshiya Okamoto

Manabu Yumoto

Manabu Onozaki

Hidekazu Yamanaka

Masakazu Ikeda

Yasufumi Itoh

Kohichi Hatakeyama

A high voltage generating circuit includes a boosting portion (e.g., a trigger coil ()) for boosting DC voltage delivered from a DC power supply () so as to deliver high voltage at a secondary side, a switching element (e.g., a MOSFET ()) for turning on and off current flowing in the primary side of the boosting portion, and a pulse signal generating portion (B) for generating a pulse signal for controlling on and off of the switching element.

High voltage generating circuit, ion generating device and electrical apparatus

When first and second images are input, a partial image feature calculating unit calculates feature values of partial images of the two images. A maximum matching score position searching unit searches for a position of the second image that attains to the highest matching score with each of the partial images of the first image. A movement-vector-based similarity score calculating unit calculates similarity between the first and second images, using information related to that partial image whose movement vector has direction and length within a prescribed range, which movement vector representing positional relation between a reference position for measuring, for each of the partial images, the position of the partial image in the first image and the position of the maximum matching score corresponding to the partial image searched out by the maximum matching score position searching unit. The images as the object of collation may belong to the same category classified based on the feature values.

Image collating apparatus, image collating method, image collating program and computer readable recording medium recording image collating program

A router is formed by an M-input, 1-output junction unit and a 1-input, N-output branching unit. Where M and N satisfy the relation of (M>N), the transfer rate of a path between the junction unit and the branching unit is made the total sum of the transfer rates of inputs of IN to INM, whereby N times faster transfer becomes possible.

Data driven type apparatus and method with router operating at a different transfer rate than system to attain higher throughput

A self-synchronous logic circuit includes scan test compliant registers holding data and forming stages of a pipeline, and scan test compliant self-synchronous signal control circuits corresponding to respective registers and performing handshake to transfer clocks. In accordance with the clocks transferred by the scan test compliant self-synchronous signal control circuits, data processing among the scan test compliant registers proceeds. In addition to normal data processing, the scan test compliant registers have a function of serially transferring contents thereof at the time of a test. The scan test compliant self-synchronous signal control circuits are set to a state that corresponds to the end of a third way of the handshake, at the time of a test.

Growing community of inventors

Nara, Japan

Takashi Horiyama