Tohoku Pioneer Corporation

Takashi Goto

Hiroyuki Sato

Kazuhiro Satoh

Reverse bias voltage VM is applied to any one of self light emitting elements arranged on a light emitting panelunder detection mode. Current corresponding to weak current flowing to the element is supplied to a transistor Qby the operation of a current mirror circuit comprised of transistors Q, Q. The current mirror circuit is formed with the transistor Qas a control side current source transistor and transistors Qto Qas a controlled side current source transistor. The sizes of the controlled side current source transistors Qto Qare set to, for example, 1:2:4:8 with respect to the control side current source transistor Qso as to construct current amplifying means. Current value amplified by a current comparison type comparatoris compared with current value from a reference current sourceand its output is latched by a latch circuitand stored in a data register. If a weak current over a predetermined value flows when reverse bias voltage is applied to the self light emitting element, it is determined that a possibility that the self light emitting element turns into a light emission fault is high and notifying means is driven appropriately using data stored in the data register

Self light emitting type display module, electronic appliance loaded with the same module and verification method of faults in the same module

In a detection mode, a reverse bias voltage VM is applied to any one of scan lines K&#x2013;Km arranged in a light emitting display panel. The electrical potentials generated at respective data lines A&#x2013;An of this time are supplied to potential determination means J&#x2013;Jn. In the potential determination means J&#x2013;Jn, the electrical potentials generated at the respective data lines A&#x2013;An are supplied to switching elements Q&#x2013;Qvia transfer switches Q&#x2013;Q. When the electrical potentials are the threshold voltages of the switching elements Q&#x2013;Qor greater, the outputs of comparators CP&#x2013;CPn are inverted, and the states of this time are latched in latch circuits LC&#x2013;LCn to be stored in a data register. By data stored in the data register, it is determined whether or not a defect has occurred in pixels of the display panel, and the location thereof is also determined.

Self light emitting display module, electronic equipment into which the same module is loaded, and inspection method of defect state in the same module

Growing community of inventors

Yonezawa, Japan

Takashi Goto